SFFS024 May 2022 TPS62872-Q1 , TPS62873-Q1
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This document contains information for the TPS62872-Q1 and TPS62873-Q1 (WQFN package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
The TPS62872-Q1 and TPS62873-Q1 was developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for the TPS62872-Q1 and TPS62873-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 12 |
Die FIT Rate | 6 |
Package FIT Rate | 6 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for the TPS62872-Q1 and TPS62873-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
SW no output | 20% |
SW output not in specification – voltage or timing | 15% |
SW power HS or LS FET stuck on | 35% |
EN or PG false trip or fails to trip | 10% |
Switching frequency or output voltage range not in spec | 10% |
no device communication |
10% |
The FMD in Table 3-1 excludes short circuit faults across the isolation barrier. Faults for short circuit across the isolation barrier can be excluded according to ISO 61800-5-2:2016 if the following requirements are fulfilled:
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance.
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS62872-Q1 and TPS62873-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS62872-Q1 and TPS62873-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS62872-Q1 and TPS62873-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
COMP | 1 | The device does not power up and there is no output voltage. | B |
GOSNS | 2 | Normal operation, but output voltage accuracy gets worse | C |
VOSNS | 3 | Maximum duty cycle operation and no regulated output voltage. Output voltage follows the input voltage. | B |
EN | 4 | The device is disabled. Normal operation | C |
VIN | 5 | The device does not power up and there is no output voltage. | B |
GND | 6 | Normal operation | D |
SW | 7 | Potential device damage | A |
GND | 8 | Normal operation | D |
VIN | 9 | The device does not power up and there is no output voltage. | B |
PG | 10 | Normal operation and loss of PG indication | B |
MODE/SYNC | 11 | Normal operation. Power save mode is enabled. | C |
SDA | 12 | Normal operation and no I2C communication | B |
SCL | 13 | Normal operation and no I2C communication | B |
SYNC_OUT | 14 | Potential device damage | A |
VSEL | 15 | Normal operation. Defines start-up voltage | C |
FSEL | 16 | Normal operation. Defines switching frequency | C |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
COMP | 1 | No loop compensation and can cause the output voltage to oscillate. Oscillation frequency cannot be predicted. | B |
GOSNS | 2 | No output voltage regulation and can cause the output voltage to oscillate. Oscillation frequency cannot be predicted. | B |
VOSNS | 3 | No output voltage regulation and can cause the output voltage to oscillate. Oscillation frequency cannot be predicted. | B |
EN | 4 | Undetermined device operation. The device can power up and operate normal. Stays turned off | B |
VIN | 5 | Normal operation. Pin 9 is still connected. | C |
GND | 6 | Normal operation. Pin 8 and the exposed thermal pad are still connected. | C |
SW | 7 | No output voltage | B |
GND | 8 | Normal operation. Pin 6 and the exposed thermal pad are still connected. | C |
VIN | 9 | Normal operation. Pin 5 is still connected. | C |
PG | 10 | Normal operation and loss of PG indication | B |
MODE/SYNC | 11 | Normal operation. Operation mode is undefined. | B |
SDA | 12 | Normal operation and no I2C communication | B |
SCL | 13 | Normal operation and no I2C communication | B |
SYNC_OUT | 14 | Normal operation | D |
VSEL | 15 | Normal operation. Start-up voltage is undefined. | B |
FSEL | 16 | Normal operation. Switching frequency is undefined. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
COMP | 1 | 2 | The device does not power up and there is no output voltage. | B |
GOSNS | 2 | 3 | Maximum duty cycle operation and no regulated output voltage. Output voltage follows the input voltage. | B |
VOSNS | 3 | 4 | The device does not power up or there is potential device damage. | A |
EN | 4 | 5 | Potential device damage | A |
VIN | 5 | 6 | The device does not power up and there is no output voltage. | B |
GND | 6 | 7 | Potential device damage | A |
SW | 7 | 8 | Potential device damage | A |
GND | 8 | 9 | The device does not power up and there is no output voltage. | B |
VIN | 9 | 10 | Potential device damage | A |
PG | 10 | 11 | Potential device damage if MODE/SYNC is tied high. Loss of PG indication | A |
MODE/SYNC | 11 | 12 | Potential device damage if MODE/SYNC is tied high. No I2C communication | A |
SDA | 12 | 13 | Normal operation and no I2C communication | B |
SCL | 13 | 14 | Potential device damage | A |
SYNC_OUT | 14 | 15 | Potential device damage if VSEL is tied high or low | A |
VSEL | 15 | 16 | Normal operation. Defines start-up voltage and switching frequency | B |
FSEL | 16 | 1 | No output voltage regulation and can cause output voltage oscillating. Oscillation frequency cannot be predicted. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
COMP | 1 | Potential device damage | A |
GOSNS | 2 | Potential device damage | A |
VOSNS | 3 | The device does not start up. Output voltage stays low or potential device damage. | A |
EN | 4 | Potential device damage | A |
VIN | 5 | Normal operation | D |
GND | 6 | The device does not power up and there is no output voltage. | B |
SW | 7 | Potential device damage | A |
GND | 8 | The device does not power up and there is no output voltage. | B |
VIN | 9 | Normal operation | D |
PG | 10 | Potential device damage | A |
MODE/SYNC | 11 | Normal operation and forced PWM operation | C |
SDA | 12 | Potential device damage | A |
SCL | 13 | Potential device damage | A |
SYNC_OUT | 14 | Potential device damage | A |
VSEL | 15 | Normal operation. Defines start-up voltage | C |
FSEL | 16 | Normal operation. Defines switching frequency | C |
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