Data Sheet
CDx4ACT32 四通道双输入正或门
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1 特性
- 输入兼容 TTL 电压
- 缓冲输入
- 双极 F、AS 和 S 的速度，同时功耗显著降低
- 平衡传播延迟
- •±24mA 输出驱动电流
- 扇出至 15 个 F 器件
- 防 SCR 闩锁 CMOS 工艺和电路设计
- ESD 保护超过 2kV（根据 MIL-STD-883 方法 3015）
2 说明
’ACT32 器件是四通道双输入正或门。这些器件以正逻辑执行布尔函数 Y = A • B 或 Y = A + B。
器件信息
| 器件型号 | 封装(1) | 封装尺寸(2) | 本体尺寸(3) |
|---|---|---|---|
| CDx4ACT32 | D（SOIC，14） | 8.65mm × 6mm | 8.65mm × 3.9mm |
| N（PDIP，14） | 19.3mm × 9.4mm | 19.3mm × 6.35mm | |
| J（CDIP，14） | 19.55mm x 7.9mm | 19.55mm x 6.7mm |
(1) 有关更多信息，请参阅节 10。
(2) 封装尺寸（长 × 宽）为标称值，并包括引脚（如适用）。
(3) 本体尺寸（长 × 宽）为标称值，不包括引脚。
逻辑图（正逻辑）3 Pin Configuration and Functions
Figure 3-1 CD54ACT32 J Package; CD74ACT32 N or
D Package; CDIP, SOIC, or PDIP (Top View)Table 3-1 Pin Functions
| PIN | I/O | DESCRIPTION | ||
|---|---|---|---|---|
| NAME | SOIC, PDIP, CDIP | |||
| 1A | 1 | I | 1A Input | |
| 1B | 2 | I | 1B Input | |
| 1Y | 3 | O | 1Y Output | |
| 2A | 4 | I | 2A Input | |
| 2B | 5 | I | 2B Input | |
| 2Y | 6 | O | 2Y Output | |
| 3Y | 8 | O | 3Y Output | |
| 3A | 9 | I | 3A Input | |
| 3B | 10 | I | 3B Input | |
| 4Y | 11 | O | 4Y Output | |
| 4A | 12 | I | 4A Input | |
| 4B | 13 | I | 4B Input | |
| GND | 7 | — | Ground Pin | |
| NC | — | — | No Connection | |
| VCC | 14 | — | Power Pin | |
4 Specifications
4.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise
noted)(1)
| MIN | MAX | UNIT | |||
|---|---|---|---|---|---|
| VCC | Supply voltage | –0.5 | 6 | V | |
| IIK(2) | Input clamp current | (VI < 0 V or VI > VCC) | ±20 | mA | |
| IOK(2) | Output clamp current | (VO < 0 V or VO > VCC | ±50 | mA | |
| IO | Continuous output current | (VO = 0 to VCC) | ±50 | mA | |
| Continuous current through VCC or GND | ±100 | mA | |||
| Tstg | Storage temperature range | –65 | 150 | °C | |
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
