ZHCSJ75C December   2018  – June 2022 TLIN2441-Q1

PRODUCTION DATA  

  1. 1 特性
  2. 2 应用
  3. 3 说明
  4. 4 Revision History
  5. 5 说明（续）
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 ESD Ratings, IEC Specification
    4. 7.4 Recommended Operating Conditions
    5. 7.5 Thermal Information
    6. 7.6 Power Supply Characteristics
    7. 7.7 Electrical Characteristics
    8. 7.8 AC Switching Characteristics
    9. 7.9 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Test Circuit: Diagrams and Waveforms
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1  LIN Pin
        1. 9.3.1.1 LIN Transmitter Characteristics
        2. 9.3.1.2 LIN Receiver Characteristics
          1. 9.3.1.2.1 Termination
      2. 9.3.2  TXD (Transmit Input)
      3. 9.3.3  RXD (Receive Output)
      4. 9.3.4  WAKE (High Voltage Local Wake Up Input)
      5. 9.3.5  WDT/CLK (Pin Programmable Watchdog Delay Input/SPI Clock)
      6. 9.3.6  WDI/SDI (Watchdog Timer Input/SPI Serial Data In)
      7. 9.3.7  PIN/nCS (Pin Watchdog Select/SPI Chip Select)
      8. 9.3.8  LIMP (LIMP Home output – High Voltage Open Drain Output)
      9. 9.3.9  nWDR/SDO (Watchdog Timeout Reset Output/SPI Serial Data Out)
      10. 9.3.10 VSUP (Supply Voltage)
      11. 9.3.11 GND (Ground)
      12. 9.3.12 EN/nINT (Enable Input/Interrupt Output in SPI Mode)
      13. 9.3.13 nRST/nWDR (Reset Output/Watchdog Timeout Reset Output)
      14. 9.3.14 VCC (Supply Output)
      15. 9.3.15 Protection Features
        1. 9.3.15.1 TXD Dominant Time Out (DTO)
        2. 9.3.15.2 Bus Stuck Dominant System Fault: False Wake Up Lockout
        3. 9.3.15.3 Thermal Shutdown
        4. 9.3.15.4 Under Voltage on VSUP
        5. 9.3.15.5 Unpowered Device and LIN Bus
    4. 9.4 Device Functional Modes
      1. 9.4.1 Normal Mode
      2. 9.4.2 Sleep Mode
      3. 9.4.3 Standby Mode
      4. 9.4.4 Failsafe Mode
      5. 9.4.5 Wake-Up Events
        1. 9.4.5.1 Wake-Up Request (RXD)
        2. 9.4.5.2 Local Wake Up (LWU) via WAKE Terminal
      6. 9.4.6 Mode Transitions
      7. 9.4.7 Voltage Regulator
        1. 9.4.7.1 VCC
        2. 9.4.7.2 Output Capacitance Selection
        3. 9.4.7.3 Low-Voltage Tracking
        4. 9.4.7.4 Power Supply Recommendation
      8. 9.4.8 Watchdog
        1. 9.4.8.1 Watchdog Error Counter
        2. 9.4.8.2 Pin Control Mode
        3. 9.4.8.3 SPI Control Programming
        4. 9.4.8.4 Watchdog Timing
    5. 9.5 Programming
      1. 9.5.1 SPI Communication
        1. 9.5.1.1 Chip Select Not (nCS)
        2. 9.5.1.2 Serial Clock Input (CLK)
        3. 9.5.1.3 Serial Data Input (SDI)
        4. 9.5.1.4 Serial Data Output (SDO)
    6. 9.6 Registers
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
        1. 10.2.1.1 Normal Mode Application Note
        2. 10.2.1.2 Standby Mode Application Note
        3. 10.2.1.3 TXD Dominant State Timeout Application Note
      2. 10.2.2 Detailed Design Procedures
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 接收文档更新通知
    3. 13.3 支持资源
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 术语表
  14. 14Mechanical, Packaging, and Orderable Information

7.3 ESD Ratings, IEC Specification

VALUEUNIT
V(ESD)Electrostatic discharge (1), LIN, VSUP and WAKE terminal to GND(2)IEC 61000-4-2 contact discharge±15000V
IEC 61000-4-2 air-gap discharge±15000
Powered electrostatic discharge SAEJ2962-1(4)SAEJ2962-1 contact discharge±8000V
SAEJ2962-1 air discharge±15000
TransientISO7637-2 and IEC 62215-3 Transients according to IBEE LIN EMC test spec(3)Pulse 1-450V
Pulse 2a75
Pulse 3a-225
Pulse 3b225
(1) IEC 61000-4-2 is a system-level ESD test. Results given here are specific to the IBEE LIN EMC Test specification conditions per IEC TS 62228. Different system-level configurations may lead to different results
(2) Testing performed at 3rd party IBEE Zwickau test house, test report available upon request.
(3) ISO7637 is a system-level transient test. Results given here are specific to the IBEE LIN EMC Test specification conditions. Different system-level configurations may lead to different results.
(4) SAEJ2962-1 Testing performed at 3rd party US3 approved EMC test facility, test report available upon request.