TIC12400-Q1 是一款先进的多开关检测接口 (MSDI),用于检测 12V 汽车系统中的外部开关状态。TIC12400-Q1 配有集成的 10 位 ADC,用于对多位模拟开关进行监控,并采用比较器以独立于 MCU 的方式对数字开关进行监控。可为 ADC 和比较器设定检测阈值,从而支持各种开关拓扑和系统非理想特性。该器件监控多达 24 路直接开关输入,并可配置其中 10 路输入以监控接地或连接到电池的开关。可为每路输入设定 6 种独特的湿性电流设置,从而支持不同的应用场景。该器件支持所有开关输入的唤醒操作,因此无需持续使 MCU 保持活动状态,进而可降低系统功耗。TIC12400-Q1 还提供集成故障检测、ESD 保护和诊断功能,从而提高系统稳健性。TIC12400-Q1 支持 2 种工作模式:连续模式和轮询模式。连续模式下将连续提供湿性电流。轮询模式下将根据可编程计时器来定期接通湿性电流以对输入状态进行采样,从而显著降低系统功耗。
器件型号 | 封装(1) | 封装尺寸(标称值) |
---|---|---|
TIC12400-Q1 | TSSOP (38) | 9.70mm × 4.40mm |
Changes from Revision B (February 2020) to Revision C (February 2022)
Changes from Revision A (September 2017) to Revision B (February 2020)
Changes from Revision * (August 2017) to Revision A (September 2017)
PIN | TYPE(1) | DESCRIPTION | |
---|---|---|---|
NO. | NAME | ||
1 | IN13 | I/O | Ground switch monitoring input with current source. |
2 | IN14 | I/O | Ground switch monitoring input with current source. |
3 | IN15 | I/O | Ground switch monitoring input with current source. |
4 | IN16 | I/O | Ground switch monitoring input with current source. |
5 | IN17 | I/O | Ground switch monitoring input with current source. |
6 | IN18 | I/O | Ground switch monitoring input with current source. |
7 | IN19 | I/O | Ground switch monitoring input with current source. |
8 | IN20 | I/O | Ground switch monitoring input with current source. |
9 | AGND | P | Ground for analog circuitry. |
10 | IN21 | I/O | Ground switch monitoring input with current source. |
11 | IN22 | I/O | Ground switch monitoring input with current source. |
12 | IN23 | I/O | Ground switch monitoring input with current source. |
13 | IN0 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
14 | IN1 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
15 | CS | I | Active-low input. Chip select from the controller for the SPI Interface. |
16 | SCLK | I | Serial clock output from the controller for the SPI Interface. |
17 | SI | I | Serial data input for the SPI Interface. |
18 | SO | O | Serial data output for the SPI Interface. |
19 | VDD | P | 3.3 V to 5.0 V logic supply for the SPI communication. The SPI I/Os are not fail-safe protected: VDD needs to be present during any SPI traffic to avoid excessive leakage currents and corrupted SPI I/O logic levels. |
20 | CAP_A | I/O | External capacitor connection for the analog LDO. Use capacitance value of 100 nF. |
21 | RESET | I | Keep RESET low for normal operation and drive RESET high and release it to perform a hardware reset of the device. The RESET pin is connected to ground via a 1MΩ pull-down resistor. If not used, the RESET pin shall be grounded to avoid any accidental device reset due to coupled noise onto this pin. |
22 | CAP_Pre | I/O | External capacitor connection for the pre-regulator. Use capacitance value of 1 μF. |
23 | CAP_D | I/O | External capacitor connection for the digital LDO. Use capacitance value of 100 nF. |
24 | INT | O | Open drain output. Pulled low (internally) upon change of state on the input or occurrence of a special event. |
25 | IN2 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
26 | IN3 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
27 | IN4 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
28 | DGND | P | Ground for digital circuitry. |
29 | IN5 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
30 | IN6 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
31 | IN7 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
32 | IN8 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
33 | IN9 | I/O | Ground/VBAT switch monitoring input with configurable current sink or source. |
34 | IN10 | I/O | Ground switch monitoring input with current source. |
35 | IN11 | I/O | Ground switch monitoring input with current source. |
36 | IN12 | I/O | Ground switch monitoring input with current source. |
37 | VS | P | Power supply input pin. |
38 | VS | P | Power supply input pin. |
--- | EP | P | Exposed Pad. The exposed pad is not electrically connected to AGND or DGND. Connect EP to the board ground to achieve rated thermal and ESD performance. |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Input voltage | VS, INT | -0.3 | 40(2) | V |
VDD, SCLK, SI, SO, CS, RESET | -0.3 | 6 | V | |
IN0- IN23 | -24 | 40(2) | V | |
CAP_Pre | -0.3 | 5.5 | V | |
CAP_A | -0.3 | 5.5 | V | |
CAP_D | -0.3 | 2 | V | |
Operating junction temperature, TJ | -40 | 150 | °C | |
Storage temperature, Tstg | -55 | 155 | °C |
VALUE | UNIT | ||||
---|---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per AEC Q100-002(1) | All pins | ±2000 | V |
Pins IN0-IN23(2) | ±4000 | ||||
Charged-device model (CDM), per AEC Q100-011 | All pins | ±500 | |||
Corner pins (pin 1, 19, 20 and 38) | ±750 | ||||
Contact discharge, un-powered, per ISO- 10605:
|
Pins IN0-IN23 | ±8000 | |||
Contact discharge, powered-up, per ISO- 10605:
|
Pins IN0-IN23 | ±8000 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
VS | Power supply voltage | 4.5 | 35 (2) | V | ||
VDD | Logic supply voltage | 3.0 | 5.5 | V | ||
V/INT | INT pin voltage | 0 | 35(2) | V | ||
VINX | IN0 to IN23 input voltage | 0 | 35(2) | V | ||
VRESET | RESET pin voltage | 0 | 5.5 | V | ||
VSPI_IO | SPI input/output logic level | 0 | VDD | V | ||
fSPI | SPI communication frequency | 20(1) | 4M | Hz | ||
TA | Operating free-air temperature | -40 | 125 | °C |
THERMAL METRIC(1) | TIC12400-Q1 | UNIT | |
---|---|---|---|
DCP (TSSOP) | |||
38 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 33.6 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 18.4 | °C/W |
RθJB | Junction-to-board thermal resistance | 15.2 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.5 | °C/W |
ψJB | Junction-to-board characterization parameter | 15.0 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 1.2 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
POWER SUPPLY | |||||||
IS_CONT | Continuous mode VS power supply current | Continuous mode, IWETT= 10 mA, all switches open, no active ADC conversion or comparator comparison, no unserviced interrupt | 5.6 | 7 | mA | ||
IS_POLL_COMP_25 | Polling mode VS power supply average current in comparator mode | TA= 25° | Polling mode, tPOLL= 64 ms, tPOLL_ACT= 128 µs, all 24 channels active and configured to comparator mode, all switches open, IWETT= 10 mA, no unserviced interrupt | 68 | 100 | µA | |
IS_POLL_COMP_85 | TA= -40° to 85°C | 68 | 110 | µA | |||
IS_POLL_COMP | TA= -40° to 125°C | 68 | 170 | µA | |||
IS_POLL_ADC_25 | Polling mode VS power supply average current in ADC mode | TA= 25° | Polling mode, tPOLL= 64 ms, tPOLL_ACT= 128 µs, all 24 channels active and configured to ADC mode, all switches open, IWETT= 10 mA, no unserviced interrupt | 75 | 105 | µA | |
IS_POLL_ADC_85 | TA= -40° to 85°C | 75 | 120 | µA | |||
IS_POLL_ADC | TA= -40° to 125°C | 75 | 180 | µA | |||
IS_RESET | Reset mode VS power supply current | Reset mode, VRESET= VDD. VS= 12 V, all switches open, TA=25°C | 12 | 17 | µA | ||
IS_IDLE_25 | VS power supply average current in idle state | TRIGGER bit in CONFIG register = logic 0, TA= 25°C, no unserviced interrupt | 50 | 75 | µA | ||
IS_IDLE_85 | TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 85°C, no unserviced interrupt | 50 | 95 | µA | |||
IS_IDLE | TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 125°C, no unserviced interrupt | 50 | 145 | µA | |||
IDD | Logic supply current from VDD | SCLK = SI = 0 V, CS = INT = VDD, no SPI communication | 1.5 | 10 | µA | ||
VPOR_R | Power on reset (POR) voltage for VS | Threshold for rising VS from device OFF condition resulting in INT pin assertion and a flagged POR bit in the INT_STAT register | 3.85 | 4.5 | V | ||
VPOR_F | Threshold for falling VS from device normal operation to reset mode and loss of SPI communication | 1.95 | 2.8 | V | |||
VOV_R | Over-voltage (OV) condition for VS | Threshold for rising VS from device normal operation resulting in INT pin assertion and a flagged OV bit in the INT_STAT register | 35 | 40 | V | ||
VOV_HYST | Over-voltage (OV) condition hysteresis for VS | 1 | 3.5 | V | |||
VUV_R | Under-voltage (UV) condition for VS | Threshold for rising VS from under-voltage condition resulting in INT pin assertion and a flagged UV bit in the INT_STAT register | 3.85 | 4.5 | V | ||
VUV_F | Threshold for falling VS from under-voltage condition resulting in INT pin assertion and a flagged UV bit in the INT_STAT register | 3.7 | 4.4 | V | |||
VUV_HYST | Under-voltage (UV) condition hysteresis for VS(1) | 75 | 275 | mV | |||
VDD_F | Threshold for falling VDD resulting in loss of SPI communication | 2.5 | 2.9 | V | |||
VDD_HYST | Valid VDD voltage hysteresis | 50 | 150 | mV | |||
WETTING CURRENT ACCURACY (DIGITAL SWITCHES, MAXIMUM RESISTANCE VALUE WITH SWITCH CLOSED ≤ 100Ω , MINIMUM RESISTANCE VALUE WITH SWITCH OPEN ≥ 5000 Ω) | |||||||
IWETT (CSO) | Wetting current accuracy for CSO (switch closed) | 1 mA setting | 4.5 V ≤ VS ≤ 35 V | 0.84 | 1 | 1.14 | mA |
2 mA setting | 1.71 | 2 | 2.32 | ||||
5 mA setting | 4.5 V ≤ VS < 5 V | 2.39 | 5.5 | ||||
5 V ≤ VS ≤ 35 V | 4.3 | 5 | 5.6 | ||||
10 mA setting | 4.5 V ≤ VS < 6 V | 2.4 | 11 | ||||
6 V ≤ VS ≤ 35 V | 8.4 | 10 | 11.4 | ||||
15 mA setting | 4.5 V ≤ VS < 6.5 V | 2.4 | 16.5 | ||||
6.5 V ≤ VS ≤ 35 V | 12.5 | 15 | 17 | ||||
IWETT (CSI) | Wetting current accuracy for CSI (switch closed) | 1 mA setting | 4.5 V ≤ VS ≤ 35 V | 0.75 | 1.1 | 2.05 | mA |
2 mA setting | 1.6 | 2.2 | 3.3 | ||||
5 mA setting | 4.3 | 5.6 | 7.1 | ||||
10 mA setting | 9.2 | 11.5 | 13.4 | ||||
15 mA setting | 4.5 V ≤ VS < 6 V | 11 | 16.5 | 19.2 | |||
6 V ≤ VS ≤ 35 V | 13.7 | 16.5 | 19.2 | ||||
VCSI_DROP_OPEN | Voltage drop from INx pin to AGND across CSI (switch open) | 10 mA setting, RSW= 5 kΩ | 4.5 V ≤ VS ≤ 35 V | 1.7 | V | ||
15 mA setting, RSW= 5 kΩ | 1.7 | ||||||
VCSI_DROP_CLOSED | Voltage drop from INx pin to ground across CSI (switch closed) | 2 mA setting, IIN= 1 mA (4.5V ≤ VS ≤ 35V) | 4.5 V ≤ VS ≤ 35 V | 1.2 | V | ||
5 mA setting, IIN= 1mA or 2 mA | 1.3 | V | |||||
10 mA setting, IIN= 1 mA, 2 mA, or 5 mA | 1.5 | V | |||||
15 mA setting, IIN= 1 mA, 2 mA, 5 mA, or 10 mA | 2.1 | V | |||||
WETTING CURRENT ACCURACY (ANALOG SWITCHES) | |||||||
IWETT | Wetting current accuracy | 1 mA setting | 4.5 V ≤ VS ≤ 35 V, VS – VINX ≥ 2.5 V | 0.88 | 1 | 1.13 | mA |
2 mA setting | 1.8 | 2 | 2.25 | ||||
5 mA setting | 5.5 V ≤ VS ≤ 35 V, VS – VINX ≥ 2.5 V | 4.3 | 5 | 5.5 | |||
5.5 V ≤ VS ≤ 35 V, VS – VINX ≥ 3 V | 4.5 | 5 | 5.5 | ||||
10 mA setting | 6 V ≤ VS ≤ 35 V, VS – VINX ≥ 4 V | 9 | 10 | 11 | |||
15 mA setting | 6.5 V ≤ VS ≤ 35 V, VS – VINX ≥ 5 V | 12.5 | 15 | 16.5 | |||
LEAKAGE CURRENTS | |||||||
IIN_LEAK_OFF | Leakage current at input INx when channel is disabled | 0 V ≤ VINx ≤ VS , channel disabled (EN_INx register bit= logic 0) | -4 | 5.3 | µA | ||
IIN_LEAK_OFF_25 | 0 V ≤ VINx ≤ VS , channel disabled (EN_INx register bit= logic 0), TA = 25°C | -0.5 | 0.5 | ||||
IIN_LEAK_0mA | Leakage current at input INx when wetting current setting is 0mA | 0 V ≤ VINx ≤ 6 V, 6 V ≤ VS ≤ 35 V , IWETT setting = 0 mA | -110 | 110 | µA | ||
µA | |||||||
IIN_LEAK_LOSS_OF_GND | Leakage current at input INx under loss of GND condition | VS = 24 V, 0 V ≤ VINx ≤ 24 V, all grounds (AGND, DGND, and EP) = 24 V, VDD shorted to the grounds(1) | -5 | µA | |||
IIN_LEAK_LOSS_OF_VS | Leakage current at input INx under loss of VS condition | 0 V ≤ VINx ≤ 24 V, VS shorted to the grounds = 0 V, VDD = 0 V | 5 | µA | |||
LOGIC LEVELS | |||||||
V/INT_L | INT output low voltage | I/INT = 2 mA | 0.35 | V | |||
I/INT = 4 mA | 0.6 | ||||||
VSO_L | SO output low voltage | ISO = 2 mA | 0.2VDD | V | |||
VSO_H | SO output high voltage | ISO = -2 mA | 0.8VDD | V | |||
VIN_L | SI, SCLK, and CS input low voltage | 0.3VDD | V | ||||
VIN_H | SI, SCLK, and CS input high voltage | 0.7VDD | V | ||||
VRESET_L | RESET input low voltage | 0.8 | V | ||||
VRESET_H | RESET input high voltage | 1.6 | V | ||||
RRESET_25 | RESET pin internal pull-down resistor | VRESET= 0 to 5.5 V, TA =25°C | 0.85 | 1.25 | 1.7 | MΩ | |
RRESET | VRESET= 0 to 5.5 V, TA = –40° to 125°C | 0.2 | 2.1 | ||||
SWITCH INPUT AND VS MEASUREMENT CONVERSION PARAMETERS | |||||||
RES | Resolution | 10 | Bits | ||||
VOFFSET | ADC Offset error | 0 mA setting | –1 | 0 | 1 | LSB | |
VFSE | ADC Full-scale error | 0 mA setting | –10 | 0 | 10 | LSB | |
OUTSW | Switch input conversion output | 1 mA setting | 4.5 V ≤ VS ≤ 35 V, 100 Ω resistance to ground at INx | 12 | 17 | 26 | LSB |
4.5 V ≤ VS ≤ 35 V, 300 Ω resistance to ground at INx | 42 | 51 | 64 | ||||
4.5 V ≤ VS ≤ 35 V, 600 Ω resistance to ground at INx | 87 | 102 | 122 | ||||
2 mA setting | 4.5 V ≤ VS ≤ 35 V, 100 Ω resistance to ground at INx | 28 | 34 | 45 | LSB | ||
4.5 V ≤ VS ≤ 35 V, 300 Ω resistance to ground at INx | 89 | 102 | 122 | ||||
4.5 V ≤ VS ≤ 35 V, 600 Ω resistance to ground at INx | 181 | 205 | 236 | ||||
5 mA setting | 5 V ≤ VS ≤ 35 V, 100 Ω resistance to ground at INx | 72 | 85 | 105 | LSB | ||
5 V ≤ VS ≤ 35 V, 300 Ω resistance to ground at INx | 223 | 256 | 296 | ||||
5 V ≤ VS ≤ 35 V, 600 Ω resistance to ground at INx | 393 | 512 | 620 | ||||
10 mA setting | 6 V ≤ VS ≤ 35 V, 100 Ω resistance to ground at INx | 142 | 171 | 202 | LSB | ||
6 V ≤ VS ≤ 35 V, 250 Ω resistance to ground at INx | 333 | 427 | 486 | ||||
6 V ≤ VS ≤ 35 V, 400 Ω resistance to ground at INx | 430 | 683 | 823 | ||||
15 mA setting | 6.5 V ≤ VS ≤ 35 V, 100 Ω resistance to ground at INx | 166 | 256 | 301 | LSB | ||
6.5 V ≤ VS ≤ 35 V, 200 Ω resistance to ground at INx | 325 | 512 | 582 | ||||
6.5 V ≤ VS ≤ 35 V, 300 Ω resistance to ground at INx | 450 | 768 | 879 | ||||
OUTVS | VS measurement output tolerance to full-scale range | VS measurements (VS ≥ 4.5 V), VS_RATIO= 0 in register CONFIG | ±2% | ||||
VS measurements (VS ≥ 4.5 V), VS_RATIO= 1 in register CONFIG | ±2% | ||||||
VFSR | Input full-scale range | INx measurements | 6 | V | |||
VS measurements (VS ≥ 4.5 V), VS_RATIO= 0 in register CONFIG | 9 | ||||||
VS measurements (VS ≥ 4.5 V), VS_RATIO= 1 in register CONFIG | 30 | ||||||
RIN, SC | Input resistance | INx measurements | 240 | kΩ | |||
ADC Equivalent input resistance, VS above 7 V | Input switch measurement, ILOAD= 30 µA | 135 | 234 | 356 | kΩ | ||
RIN, COMP | ADC Equivalent input resistance, VS above 7 V | THRES_COMP Setting = 2 V | 88 | 130 | 172 | kΩ | |
THRES_COMP Setting = 2.7 V | 85 | 126 | 170 | ||||
THRES_COMP Setting = 3 V | 73 | 105 | 137 | ||||
THRES_COMP Setting = 4 V | 68 | 95 | 124 | ||||
RRATIO | Input voltage divider factor(1) | INx measurements | 2 | - | |||
VS measurements (VS ≥ 4.5 V), VS_RATIO = 0 in register CONFIG | 3 | - | |||||
VS measurements (VS ≥ 4.5 V), VS_RATIO = 1 in register CONFIG | 10 | - | |||||
COMPARATOR PARAMETERS | |||||||
VTH_ COMP_2V | Comparator threshold for 2 V | THRES_COMP = 2 V | 1.85 | 2.25 | V | ||
VTH_ COMP_2p7V | Comparator threshold for 2.7 V | THRES_COMP = 2.7 V | 2.4 | 2.9 | V | ||
VTH_ COMP_3V | Comparator threshold for 3 V | THRES_COMP = 3 V | 2.85 | 3.3 | V | ||
VTH_ COMP_4V | Comparator threshold for 4 V | THRES_COMP = 4 V | 3.7 | 4.35 | V | ||
VS_COMP | Minimum VS requirement for proper detection | THRES_COMP = 2 V | 4.5 | V | |||
THRES_COMP = 2.7 V | 5 | ||||||
THRES_COMP = 3 V | 5.5 | ||||||
THRES_COMP = 4 V | 6.5 | ||||||
RIN, COMP | Comparator equivalent input resistance | THRES_COMP = 2 V | 30 | 130 | kΩ | ||
THRES_COMP = 2.7 V | 35 | 130 | |||||
THRES_COMP = 3 V | 35 | 105 | |||||
THRES_COMP = 4 V | 43 | 95 |
PARAMETER | TEST CONDITION | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
SWITCH MONITORING, INTERRUPT, STARTUP AND RESET | ||||||
tPOLL_ACT | Polling active time accuracy | Polling mode | -12% | 12% | ||
tPOLL_ACT_M | Polling active time accuracy for matrix inputs | Polling mode with matrix enabled | -12% | 12% | ||
tPOLL | Polling time accuracy | Polling mode | -12% | 12% | ||
tCOMP | Comparator detection time | 18 | µs | |||
tADC | ADC Conversion time | Sample and hold time included | 24 | µs | ||
tCCP_TRAN | Transition time between last input sampling and start of clean current | 20 | µs | |||
tCCP_ACT | Clean current active time | -12% | 12% | |||
tSTARTUP | Polling startup time | 200 | 300 | 400 | µs | |
tINT_ACTIVE | Active INT assertion duration | 1.5 | 2 | 2.5 | ms | |
tINT_INACTIVE | INT de-assertion duration during a pending interrupt | 3 | 4 | 5 | ms | |
tINT_IDLE | Interrupt idle time | 80 | 100 | 120 | µs | |
tRESET | Time required to keep the RESET pin high to successfully reset the device (no pending interrupt)(1) | 2 | µs | |||
tREACT | Delay between a fault event (OV, UV, TW, or TSD) to a high to low transition on the INT pin | See Figure 7-2 for OV example. | 20 | µs | ||
SPI INTERFACE | ||||||
tLEAD | Falling edge of CS to rising edge of SCLK setup time | 100 | ns | |||
tLAG | Falling edge of SCLK to rising edge of CS setup time | 100 | ns | |||
tSU | SI to SCLK falling edge setup time | 30 | ns | |||
tHOLD | SI hold time after falling edge of SCLK | 20 | ns | |||
tVALID | Time from rising edge of SCLK to valid SO data | 70 | ns | |||
tSO(EN) | Time from falling edge of CS to SO low-impedance | 60 | ns | |||
tSO(DIS) | Time from rising edge of CS to SO high-impedance | Loading of 1 kΩ to GND. See Figure 7-3. | 60 | ns | ||
tR | SI, CS, and SCLK signals rise time | 5 | 30 | ns | ||
tF | SI, CS, and SCLK signals fall time | 5 | 30 | ns | ||
tINTER_FRAME | Delay between two SPI communication ( CS low) sequences | 1.5 | µs | |||
tCKH | SCLK High time | 120 | ns | |||
tCKL | SCLK Low time | 120 | ns | |||
tINITIATION | Delay between valid VDD voltage and initial SPI communication | 45 | µs |
TA = 25°C |
TA = 25°C |
I(WETT) = 2 mA | 4.5 V ≤ VS ≤ 35 V |
I(WETT) = 5 mA | 5.5 V ≤ VS ≤ 35 V |
I(WETT) = 10 mA | 6 V ≤ VS ≤ 35 V |
I(WETT) = 15 mA | 6.5 V ≤ VS ≤ 35 V |
VS = 12 V |
I(WETT) = 1 mA | 4.5 V ≤ VS ≤ 35 V |
I(WETT) = 5 mA | 4.5 V ≤ VS < 5.5 V |
I(WETT) = 10 mA | 4.5 V ≤ VS < 6 V |
I(WETT) = 15 mA | 4.5 V ≤ VS < 6.5 V |
The TIC12400-Q1 is an advanced 24-input Multiple Switch Detection Interface (MSDI) device designed to detect external mechanical switch status in a 12 V automotive system by acting as an interface between the switches and the low-voltage microcontroller. The TIC12400-Q1 is an integrated solution that replaces many discrete components and provides integrated protection, input serialization, and system wake-up capability.
The device monitors 14 switches to GND and 10 additional switches that can be programmed to be connected to either GND or VBAT. It features SPI interface to report individual switch status and provides programmability to control the device operation. The TIC12400-Q1 features a 10-bit ADC which is useful to monitor analog inputs such as resistor coded switches that have multiple switching positions. To monitor only digital switches, an integrated comparator can be used instead to monitor the input status. The device has 2 modes of operation: continuous mode and polling mode. The polling mode is a low-power mode that can be activated to reduce current drawn in the system by only turning on the wetting current for a small duty cycle to detect switch status changes. An interrupt is generated upon detection of switch status change and it can be used to wake up the microcontroller to bring the entire system back to operation.