UCC20520 是一款隔离式单输入、双通道栅极驱动器,其峰值拉电流为 4A,峰值灌电流为 6A。该器件设计用于驱动高达 5MHz 的功率 MOSFET、IGBT 和 SiC MOSFET,具有一流的传播延迟和脉宽失真度。
输入侧通过 5.7kVRMS 增强型隔离层与两个输出驱动器隔离,具有最少100V/ns的共模瞬态抗扰度 (CMTI) 。两个次级侧驱动器之间的内部功能隔离,支持的工作电压高达 1500 VDC。
该驱动器可用于具有可编程死区时间 (DT) 的半桥驱动器。禁用引脚在设为高电平时可同时关断两个输出,并在开路或接地时允许正常运行。作为一种故障安全措施,初级侧逻辑故障强制两个输出均为低电平。
此器件接受高达 25V 的 VDD 电源电压。3V 到 18V 的宽输入电压 VCCI 范围使得该驱动器适用于与模拟和数字控制器连接。所有电源电压引脚都具有欠压锁定 (UVLO) 保护功能。
凭借所有这些高级特性,UCC20520 能够在各种各样的电源应用中实现高效率、高电源密度和稳健性。
零件编号 | 封装(1) | 封装尺寸(标称值) |
---|---|---|
UCC20520 | DW SOIC (16) | 10.30mm × 7.50mm |
Changes from Revision * (November 2016) to Revision A (January 2022)
PIN | TYPE1 | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
DISABLE | 5 | I | Disables both driver outputs if asserted high, enables if set low or left open. This pin is pulled low internally if left open. It is recommended to tie this pin to ground if not used to achieve better noise immunity. |
DT | 6 | I | Programmable dead time function. Tying DT to VCCI disables the DT function with dead time ≅ 0 ns. Leaving DT open sets the dead time to <15 ns. Placing a 500-Ω to 500-kΩ resistor (RDT) between DT and GND adjusts dead time according to: DT (in ns) = 10 × RDT (in kΩ). It is recommended to parallel a ceramic capacitor, ≥2.2-nF, with RDT to achieve better noise immunity. |
GND | 4 | P | Primary-side ground reference. All signals in the primary side are referenced to this ground. |
NC | 2 | – | No connection. |
NC | 7 | – | No connection. |
NC | 12 | – | No connection. |
NC | 13 | – | No connection. |
OUTA | 15 | O | Output of driver A. Connect to the gate of the A channel FET or IGBT. Output A is in phase with PWM input with a propagation delay |
OUTB | 10 | O | Output of driver B. Connect to the gate of the B channel FET or IGBT. Output B is always complementary to output A with a programmed dead time. |
PWM | 1 | I | PWM input has a TTL/CMOS compatible input threshold. This pin is pulled low internally if left open. |
VCCI | 3 | P | Primary-side supply voltage. Locally decoupled to GND using a low ESR/ESL capacitor located as close to the device as possible. |
VCCI | 8 | P | Primary-side supply voltage. This pin is internally shorted to pin 3. |
VDDA | 16 | P | Secondary-side power for driver A. Locally decoupled to VSSA using a low ESR/ESL capacitor located as close to the device as possible. |
VDDB | 11 | P | Secondary-side power for driver B. Locally decoupled to VSSB using a low ESR/ESL capacitor located as close to the device as possible. |
VSSA | 14 | P | Ground for secondary-side driver A. Ground reference for secondary side A channel. |
VSSB | 9 | P | Ground for secondary-side driver B. Ground reference for secondary side B channel. |
MIN | MAX | UNIT | |
---|---|---|---|
VCCI to GND | –0.3 | 20 | V |
VDDA-VSSA, VDDB-VSSB | –0.3 | 30 | V |
OUTA to VSSA, OUTB to VSSB | –0.3 | VVDDA+0.3, VVDDB+0.3 | V |
OUTA to VSSA, OUTB to VSSB, Transient for 200 ns | –2 | VVDDA+0.3, VVDDB+0.3 | V |
PWM, DIS, DT to GND | –0.3 | VVCCI+0.3 | V |
PWM Transient for 50 ns | –5 | VVCCI+0.3 | V |
VSSA-VSSB, VSSB-VSSA | 1500 | V | |
Junction temperature, TJ (2) | –40 | 150 | °C |
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±4000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1500 |
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
VCCI | VCCI Input supply voltage | 3 | 18 | V | |
VDDA, VDDB | Driver output bias supply | 9.2 | 25 | V | |
TA | Ambient Temperature | –40 | 125 | °C | |
TJ | Junction Temperature | –40 | 130 | °C |
THERMAL METRIC(1) | UCC20520 | UNIT | |
---|---|---|---|
DW-16 (SOIC) | |||
RθJA | Junction-to-ambient thermal resistance | 78.1 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 11.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 48.4 | °C/W |
ψJT | Junction-to-top characterization parameter | 12.5 | °C/W |
ψJB | Junction-to-board characterization parameter | 48.4 | °C/W |
VALUE | UNIT | |||
---|---|---|---|---|
PD | Power dissipation by UCC20520DW | VCCI = 18 V, VDDA/B = 12 V, PWM = 3.3 V, 3 MHz 50% duty cycle square wave 1-nF load | 1.05 | W |
PDI | Power dissipation by primary side of UCC20520DW | 0.05 | W | |
PDA, PDB | Power dissipation by secondary driver side of UCC20520DW | 0.5 | W |
PARAMETER | TEST CONDITIONS | VALUE | UNIT | |
---|---|---|---|---|
CLR | External clearance(1) | Shortest terminal to terminal distance through air | > 8 | mm |
CPG | External creepage(1) | Shortest terminal to terminal distance across the package surface | > 8 | mm |
DTI | Distance through insulation | Distance through internal isolation (internal clearance) | >21 | µm |
CTI | Comparative tracking index | DIN EN 60112 (VDE 0303-11); IEC 60112 | > 600 | V |
Material group | According to IEC 60664-1 | I | ||
Overvoltage category per IEC 60664-1 | Rated mains voltage ≤ 600 VRMS | I-IV | ||
Rated mains voltage ≤ 1000 VRMS | I-III | |||
DIN V VDE 0884-10 (VDE V 0884-10): 2006-2012(2) | ||||
VIORM | Maximum repetitive peak isolation voltage | AC voltage (bipolar) | 2121 | VPK |
VIOWM | Maximum isolation working voltage | Time dependent dielectric breakdown (TDDB) test, (See Figure 6-1) | 1500 | VRMS |
2121 | VDC | |||
VIOTM | Maximum transient isolation voltage | VTEST = VIOTM t = 60 sec (qualification) t = 1 sec (100% production) | 8000 | VPK |
VIOSM | Maximum surge isolation voltage(3) | Test method per IEC 60065, 1.2/50 µs waveform, VTEST = 1.6 × VIOSM = 12800 VPK (qualification) | 8000 | VPK |
qpd | Apparent charge(4) | Method a, After Input/Output safety test subgroup 2/3. Vini = VIOTM, tini = 60s;
Vpd(m) = 1.2 X VIORM = 2545 VPK, tm = 10s | <5 | pC |
Method a, After environmental tests subgroup 1. Vini = VIOTM, tini = 60s;
Vpd(m) = 1.6 X VIORM = 3394 VPK, tm = 10s | <5 | |||
Method b1; At routine test (100% production) and preconditioning (type test) Vini = VIOTM; tini = 1s; Vpd(m) = 1.875 * VIORM = 3977 VPK , tm = 1s | <5 | |||
CIO | Barrier capacitance, input to output(5) | VIO = 0.4 sin (2πft), f =1 MHz | 1.2 | pF |
RIO | Isolation resistance, input to output | VIO = 500 V at TA = 25°C | > 1012 | Ω |
VIO = 500 V at 100°C ≤ TA ≤ 125°C | > 1011 | |||
VIO = 500 V at TS =150°C | > 109 | |||
Pollution degree | 2 | |||
Climatic category | 40/125/21 | |||
UL 1577 | ||||
VISO | Withstand isolation voltage | VTEST = VISO = 5700 VRMS, t = 60 sec. (qualification),
VTEST = 1.2 × VISO = 6840VRMS, t = 1 sec (100% production) | 5700 | VRMS |
VDE | CSA | UL | CQC |
---|---|---|---|
Certified according to DIN VDE V 0884-10 (VDE V 0884-10):2006-12 and DIN EN 60950-1 (VDE 0805 Teil 1):2011-01 | Approved under CSA Component Acceptance Notice 5A, IEC 60950-1 and IEC 60601-1 | Certified according to UL 1577 component recognition program | Certified according to GB 4943.1-2011 |
Reinforced insulation maximum transient isolation voltage, 8000 VPK; maximum repetitive peak isolation voltage, 2121 VPK; maximum surge isolation voltage, 8000 VPK | Reinforced insulation per CSA 60950-1-07+A1+A2 and IEC 60950-1 2nd Ed. | Single protection, 5700 VRMS | Reinforced insulation, Altitude ≤ 5000 m, Tropical climate, 400 VRMS maximum working voltage |
Certification number: 40040142 | Agency qualification planned | File number: E181974 | Certification number: CQC16001155011 |
PARAMETER | TEST CONDITIONS | SIDE | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|---|
IS | Safety output supply current | RθJA = 78.1°C/W, VDDA/B = 12 V, TA = 25°C, TJ = 150°C
See Figure 6-2 | DRIVER A, DRIVER B | 64 | mA | ||
RθJA = 78.1°C/W, VDDA/B = 25 V, TA = 25°C, TJ = 150°C | DRIVER A, DRIVER B | 31 | mA | ||||
PS | Safety supply power | RθJA = 78.1°C/W, TA = 25°C, TJ = 150°C
See Figure 6-3 | INPUT | 50 | mW | ||
DRIVER A | 775 | ||||||
DRIVER B | 775 | ||||||
TOTAL | 1600 | ||||||
TS | Safety temperature | 150 | °C |
The maximum safety temperature is the maximum junction temperature specified for the device. The power dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the Section 6.4 table is that of a device installed on a High-K test board for leaded surface mount packages. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus the power times the junction-to-air thermal resistance.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY CURRENTS | ||||||
IVCCI | VCCI quiescent current | DISABLE = VCCI | 1.5 | 2.0 | mA | |
IVDDA, IVDDB | VDDA and VDDB quiescent current | DISABLE = VCCI | 1.0 | 1.8 | mA | |
IVCCI | VCCI operating current | (f = 500 kHz) current per channel, COUT = 100 pF | 2.5 | mA | ||
IVDDA, IVDDB | VDDA and VDDB operating current | (f = 500 kHz) current per channel, COUT = 100 pF | 2.5 | mA | ||
VCCI SUPPLY UNDERVOLTAGE LOCKOUT THRESHOLDS | ||||||
VVCCI_ON | Rising threshold VCCI_ON | 2.55 | 2.7 | 2.85 | V | |
VVCCI_OFF | Falling threshold VCCI_OFF | 2.35 | 2.5 | 2.65 | V | |
VVCCI_HYS | Threshold hysteresis | 0.2 | V | |||
VDDA/VDDB SUPPLY UNDERVOLTAGE LOCKOUT THRESHOLDS | ||||||
VVDDA_ON, VVDDB_ON | Rising threshold VDDA_ON, VDDB_ON | 8 | 8.5 | 9 | V | |
VVDDA_OFF, VVDDB_OFF | Falling threshold VDDA_OFF, VDDB_OFF | 7.5 | 8 | 8.5 | V | |
VVDDA_HYS, VVDDB_HYS | Threshold hysteresis | 0.5 | V | |||
PWM AND DISABLE | ||||||
VPWMH, VDISH | Input high voltage | 1.6 | 1.8 | 2 | V | |
VPWML, VDISL | Input low voltage | 0.8 | 1 | 1.2 | V | |
VPWM_HYS, VDIS_HYS | Input hysteresis | 0.8 | V | |||
VPWM | Negative transient, ref to GND, 50 ns pulse | Not production tested, bench test only | –5 | V | ||
OUTPUT | ||||||
IOA+, IOB+ | Peak output source current | CVDD = 10 µF, CLOAD = 0.18 µF, f = 1 kHz, bench measurement | 4 | A | ||
IOA-, IOB- | Peak output sink current | CVDD = 10 µF, CLOAD = 0.18 µF, f = 1 kHz, bench measurement | 6 | A | ||
ROHA, ROHB | Output resistance at high state | IOUT = –10 mA, TA = 25°C, ROHA, ROHBdo not represent drive pull-up performance. See tRISE in Section 6.10 and Section 8.3.4 for details. | 5 | Ω | ||
ROLA, ROLB | Output resistance at low state | IOUT = 10 mA, TA = 25°C | 0.55 | Ω | ||
VOHA, VOHB | Output voltage at high state | VVDDA, VVDDB = 12 V, IOUT = –10 mA, TA = 25°C | 11.95 | V | ||
VOLA, VOLB | Output voltage at low state | VVDDA, VVDDB = 12 V, IOUT = 10 mA, TA = 25°C | 5.5 | mV | ||
DEADTIME AND OVERLAP PROGRAMMING | ||||||
Dead time | Pull DT pin to VCCI | 0 | ns | |||
DT pin is left open, min spec characterized only, tested for outliers | 8 | 15 | ns | |||
RDT = 20 kΩ | 160 | 200 | 240 | ns |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tRISE | Output rise time, 20% to 80% measured points | COUT = 1.8 nF | 6 | 16 | ns | |
tFALL | Output fall time, 90% to 10% measured points | COUT = 1.8 nF | 7 | 12 | ns | |
tPWmin | Minimum pulse width | Output off for less than minimum, COUT = 0 pF | 20 | ns | ||
tPDHL | Propagation delay from INx to OUTx falling edges | 19 | 30 | ns | ||
tPDLH | Propagation delay from INx to OUTx rising edges | 19 | 30 | ns | ||
tPWD | Pulse width distortion |tPDLH – tPDHL| | 6 | ns | |||
tDM | Propagation delays matching between VOUTA, VOUTB | f = 100 kHz | 5 | ns | ||
CMTI | Static common-mode transient immunity (See Section 7.5) | Slew rate of GND versus VSSA and VSSB, PWM is tied to GND or VCCI | 100 | V/ns |
VDDA = VDDB= 12 V, VCCI = 3.3 V, TA = 25°C, No load unless otherwise noted.
No load |
CLOAD = 10 nF |
No load | Input low | No switching |
VDD = 12 V |
CLOAD = 1 nF |
No load |
No load | DIS is high | No switching |