SNAK022 May   2024 LMX1860-SEP

 

  1.   1
  2.   LMX1860-SEP Single-Event Effects Test Report
  3.   Trademarks
  4. 1Product Description
  5. 2Test Setup
    1. 2.1 SEL Test
    2. 2.2 SEFI Test
    3. 2.3 Test Facility
  6. 3Results
    1. 3.1 SEL Results
    2. 3.2 SEFI Results
  7. 4Summary
  8. 5References

SEFI Results

The CLKOUT and SYSREF outputs can be momentarily upset due to an ion strike. Signatures included a momentary change in the frequency or a loss of the output for a period time up to one microsecond. The outputs always returned to the programmed frequency and power. The DUT did not have to be reset or the registers reprogrammed after an SEU. The output can recover out of phase from the signal before the SEU. Figure 3-1 is an example of an SEU on SYSREF1 where the pulse momentarily broadened, but then returned to the proper frequency.

 Example of SEU on
                    SYSREF1 Figure 3-1 Example of SEU on SYSREF1