SNAK009A April   2022  – February 2024 ADC128S102-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Single-Event Latch-Up Results
  9. 6Summary
  10. 7Confidence Interval Calculations
  11. 8References
  12. 9Revision History

Abstract

The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the ADC128S102-SEP high-speed, quad-channel digital isolator. Heavy-ions with an LETEFF of 43MeV-cm2/ mg were used to irradiate the devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the ADC128S102-SEP is SEL-free up to LETEFF = 43MeV-cm2 / mg at 125°C.