SLVK210 June   2026 INA951-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Test Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event-Effects (DSEE)
    1. 6.1 Single-Event Latch-Up Results
  10. 7 Single Event Transient Results
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

5 Test Setup and Procedures

Three input supplies powers the INA951-SEP which provides VS, IN+ and IN-. The VS for the device was provided by an NI-PXIe-4137 SMU and ranged from 2.7V to 5.5V for SET and 10V for SEL. The input voltage IN+ and IN- for the device was provided by a National Instruments (NI) PXIe-4139 / 4137 SMU and ranged from –4V to 80V depending on the type of test. The last supply was a differential voltage provided by an floating NI-PXIe-4139 SMU and ranged from 0.1375V to 0.5925V.

The primary signal monitored on the EVM was VOUT. A NI PXIe-5172 scope card monitors the VOUT signal and triggers on a 10% window based on the nominal value of VOUT. All SEL, and SET testing used these conditions.

A custom-developed LabVIEW™ program (PXI-RadTest) running on a HP™-Z4 desktop computer monitors and controls all equipment. The computer communicates with the PXI chassis through an MXI controller and NI PXIe-8381 remote control module.

Table 5-1 shows the connections, limits, and compliance values used during the testing. Figure 5-1 shows a block diagram of the setup used for SEE testing of the INA951-SEP.

Table 5-1 Equipment Settings and Parameters Used During the SEE Testing of the INA951-SEP
PIN NAMEEQUIPMENT USEDCAPABILITYCOMPLIANCERANGE OF VALUES USED
IN+NI-PXIe 4139±60V,
3A		3A0.1375V, 0.2675V
IN-NI-PXIe 4137-2 ±200V,
1A		1A –4to 80V
VsNI-PXIe 4137-1±200V,
1A		1A2.7V to 12V
VOUTNI-PXIe-5172 100MS/s—100MS/s

All boards used for SEE testing were fully checked for functionality. Dry runs were also performed to ensure that the test system was stable under all bias and load conditions prior to being taken to the test TAMU & MSU. During the heavy-ion testing, the LabVIEW control program powers up the INA951-SEP device and sets the external sourcing and monitoring functions of the external equipment. After confirming functionality and stability, the beam shutter was opened to expose the device to the heavy-ion beam. The shutter remained open until the target fluence was achieved as determined by external detectors and counters. During irradiation, the NI scope cards continuously monitored the signals. When the output exceeded the pre-defined 10% window trigger, a data capture was initiated. No sudden increases in current were observed outside of normal fluctuations on any of the test runs, indicating that no SEL events occurred during any of the tests.

Block Diagram of the SEE Test Setup for the INA951-SEPFigure 5-1 Block Diagram of the SEE Test Setup for the INA951-SEP