SLVK152B August   2023  – November 2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report
  9.   B Appendix B: LDR TID Report
  10.   C Revision History

2.4 Test Configuration and Condition

HDR devices were stressed at 20 krad(Si) and 30 krad(Si) for biased and unbiased conditions.

Table 2-1 HDR Biased Device Information
Total Samples: 10
Exposure Levels:
20 krad(Si) (5 samples)30 krad(Si) (5 samples)
6, 7, 8, 9, 1016, 17, 18, 19, 20
Table 2-2 HDR Unbiased Device Information
Total Samples: 10
Exposure levels:
20 krad(Si) (5 samples)30 krad(Si) (5 samples)
1, 2, 3, 4, 511, 12, 13, 14, 15

LDR devices were stressed at 20 krad(Si) and 30 krad(Si) for biased and unbiased conditions.

Table 2-3 LDR Biased Device Information
Total Samples: 10
Exposure levels:
20 krad(Si) (5 samples)30 krad(Si) (5 samples)

50, 51, 52, 53, 54

55, 56, 57, 58, 59

Table 2-4 LDR Unbiased Device Information
Total Samples: 10
Exposure levels:
20 krad(Si) (5 samples)30 krad(Si) (5 samples)

60, 61, 62, 63, 64

65, 66, 67, 68, 69