Semiconductor ATEs, are specifically designed to test a wide range of electronic devices such as diodes, FETs, and integrated circuits like linear and mixed-signal devices. Testing is performed out by sending a stimulus signal to device under test (DUT) and capturing response from DUT. The stimulus can be either static or dynamic based on testing to be performed.

Most of these testers demand their driver circuits to be capable of generating a stimulus signal with a 16-, 18-, or 20-bit resolution, less than one ppm level of DC accuracy, ultra-low noise with wide bandwidth, and a fast update rate to test today's advanced devices.