SFFSB94 May   2026 LM4060-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
  7. 5Revision History

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the LM4060-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

  • Pin short-circuited to ground (see Table 4-2)
  • Pin open-circuited (see Table 4-3)
  • Pin short-circuited to an adjacent pin (see Table 4-4)
  • Pin short-circuited to supply (see Table 4-5)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality.
BNo device damage, but loss of functionality.
CNo device damage, but performance degradation.
DNo device damage, no impact to functionality or performance.

Figure 4-1 shows the LM4060-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the LM4060-Q1 datasheet.

LM4060-Q1 Pin DiagramFigure 4-1 Pin Diagram

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

  • Vdd (min) < Vdd < Vdd (max)
  • Cathode is connected to supply with 5kΩ resistor to keep the current in the operating range.
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
Cathode1Provided GND is strong enough compared to series resistance on cathode (to supply), cathode is pulled to GND.B
Anode2No effect to functionality; the device is operating as intended.D
NC3No effect to functionality; the device is operating as intended.D
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
Cathode1The device is not powered.B
Anode2The output does not regulate and follows the supply voltageB
NC3No effect to functionality; the device is operating as intended.D
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure EffectsFailure Effect Class
Cathode1AnodeProvided GND is strong enough compared to series resistance on cathode (to supply), cathode is pulled to GND.B
Anode2NCNo effect to functionality; the device is operating as intended.D
NC3CathodeNo effect to functionality; the device is operating as intended.D
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
Cathode1No effect to functionality; the device is operating as intended.D
Anode2The output does not regulate and follows the supply voltage.B
NC3No effect to functionality; the device is operating as intended.

D