SFFSAP0 June 2026 TRS3232E-Q1
The failure mode distribution estimation for the TRS3232E-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Charge pump failure | 25 |
| Line-driver failure | 50 |
| Receiver failure | 15 |
| Short circuit of any two I/O pins or I/O pin fault | 10 |