SFFSAN9 October 2025 LM50HV-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a failure mode analysis (FMA) for the pins of the LM50HV-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the LM50HV-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LM50HV-Q1 data sheet.
Figure 4-1 Pin DiagramTable 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VS | 1 | The device is not powered. The device is not functional. The absolute maximum ratings for all pins of the device must be met, otherwise, damage to the device is plausible. | A |
| VO | 2 | The VO pin is stuck low. The signal of the VO pin is not readable. The VO pin is non-functional. | B |
| GND | 3 | No effect, normal operation. | D |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VS | 1 | The functionality of the device is undetermined. The device is not powered if all external analog and digital pins are held low. The device can power up through the internal ESD diodes to the VS pin if there are voltages above the power-on reset threshold for the device present on any of the analog or digital pins. | B |
| VO | 2 | The VO pin is unreadable. | B |
| GND | 8 | The functionality of the device is undetermined. The device potentially does not power or connect to ground internally (through an alternate pin ESD diode) and power up. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| VS | 1 | VO | The VO pin is stuck high. The VO pin is not functional. The signal of the VO pin is unreadable. | B |
| VO | 2 | GND | The VO pin is stuck high. The VO pin is not functional. The signal of the VO pin is unreadable. | B |
| GND | 3 | VS | The functionality of the device is undetermined. The absolute maximum ratings for all pins of the device must be met, otherwise, damage to the device is plausible. | A |
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VS | 1 | No effect, normal operation. | D |
| VO | 2 | The VO pin is stuck high. The VO pin is not functional. The signal of the VO pin is unreadable. | B |
| GND | 3 | The functionality of the device is undetermined. The absolute maximum ratings for all pins of the device must be met, otherwise, damage to the device is plausible. | A |