SFFSAM5 June   2025 TPS7B4260-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DDA 8-pin HSOIC Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DDA 8-pin HSOIC Package
  7. 5Revision History

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure modes analysis (pin FMA) for the pins of the TPS7B4260-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality.
BNo device damage, but loss of functionality.
CNo device damage, but performance degradation.
DNo device damage, no impact to functionality or performance.

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

  • Device operates at free-air temperatures between –40°C and 150°C.
  • The ADJ/EN pin is driven from an external source.
  • Device operates at an input voltage of at least 3.3V and no more than 40V.
  • Device operates according to all recommended operating conditions, and the absolute maximum ratings in the data sheet for the device are not exceeded.