SFFS845 April   2024 CD74HCT4067-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

4 Pin Failure Mode Analysis (Pin FMA)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
Class Failure Effects
A Potential device damage that affects functionality
B No device damage, but loss of functionality
C No device damage, but performance degradation
D No device damage, no impact to functionality or performance

Figure 4-1 shows the CD74HCT4067-Q1 pin diagram for the SOIC package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the CD74HCT4067-Q1 data sheet.

GUID-37D641D3-B3CE-4771-8F19-1A102332AE0B-low.gif Figure 4-1 Pin Diagram (SOIC) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
COMMON I/O 1 Corruption of the signal passed onto the selected Ix pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 Address stuck low. Cannot control switch states. B
S1 11 Address stuck low. Cannot control switch states. B
GND 12 No effect, normal operation. D
S3 13 Address stuck low. Cannot control switch states. A
S2 14 Address stuck low. Cannot control switch states. A
E/ 15 Enable stuck low. Can no longer disable the device without power down. B
I15 16 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I9 22 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I8 23 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VDD 24 Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be possible. A
Table 4-3 Pin FMA for Device Open-Circuited
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
COMMON I/O 1 Corruption of the signal passed onto the Ix pins B
I7 2 Corruption of the signal passed onto the COMMON I/O pin B
I6 3 Corruption of the signal passed onto the COMMON I/O pin B
I5 4 Corruption of the signal passed onto the COMMON I/O pin B
I4 5 Corruption of the signal passed onto the COMMON I/O pin B
I3 6 Corruption of the signal passed onto the COMMON I/O pin B
I2 7 Corruption of the signal passed onto the COMMON I/O pin B
I1 8 Corruption of the signal passed onto the COMMON I/O pin B
I0 9 Corruption of the signal passed onto the COMMON I/O pin B
S0 10 Control of the address pin is lost. Cannot control switch. B
S1 11 Control of the address pin is lost. Cannot control switch. B
GND 12 Device unpowered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
S3 13 Control of the address pin is lost. Cannot control switch. B
S2 14 Control of the address pin is lost. Cannot control switch. B
E/ 15 Loss of control of the E/ pin. Cannot control the device. B
I15 16 Corruption of the signal passed onto the COMMON I/O pin B
I14 17 Corruption of the signal passed onto the COMMON I/O pin B
I13 18 Corruption of the signal passed onto the COMMON I/O pin B
I12 19 Corruption of the signal passed onto the COMMON I/O pin B
I11 20 Corruption of the signal passed onto the COMMON I/O pin B
I10 21 Corruption of the signal passed onto the COMMON I/O pin B
I9 22 Corruption of the signal passed onto the COMMON I/O pin B
I8 23 Corruption of the signal passed onto the COMMON I/O pin B
VDD 24 Device is unpowered. Device is not functional. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effect(s) Failure Effect Class
COMMON I/O 1 I7 Possible corruption of the signal passed onto the IX and COMMON I/O pin. B
I7 2 I6 Possible corruption of the signal passed onto the COMMON I/O pin. B
I6 3 I5 Possible corruption of the signal passed onto the COMMON I/O pin. B
I5 4 I4 Possible corruption of the signal passed onto the COMMON I/O pin. B
I4 5 I3 Possible corruption of the signal passed onto the COMMON I/O pin. B
I3 6 I2 Possible corruption of the signal passed onto the COMMON I/O pin. B
I2 7 I1 Possible corruption of the signal passed onto the COMMON I/O pin. B
I1 8 I0 Possible corruption of the signal passed onto the COMMON I/O pin. B
I0 9 S0 Possible corruption of the signal passed onto the COMMON I/O pin. B
S0 10 S1 Possible corruption of the signal passed onto the COMMON I/O pin. B
S1 11 GND Control of the address pin is lost. Cannot control switch. B
GND 12 S3 Not considered, corner pin. D
S3 13 S2 Control of the address pin is lost. Cannot control switch. B
S2 14 E/ Control of the address and Enable pin is lost. Cannot control switch. B
E/ 15 I15 Control of the address pin is lost. Cannot control switch. B
I15 16 I14 Possible corruption of the signal passed onto the COMMON I/O pin. B
I14 17 I13 Possible corruption of the signal passed onto the COMMON I/O pin. B
I13 18 I12 Possible corruption of the signal passed onto the COMMON I/O pin. B
I12 19 I11 Possible corruption of the signal passed onto the COMMON I/O pin. B
I11 20 I10 Possible corruption of the signal passed onto the COMMON I/O pin. B
I10 21 I9 Possible corruption of the signal passed onto the COMMON I/O pin. B
I9 22 I8 Possible corruption of the signal passed onto the COMMON I/O pin. B
I8 23 VCC Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 24 COMMON I/O Not considered, corner pin. D
Table 4-5 Pin FMA for Device Pins Short-Circuited to VDD
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
COMMON I/O 1 Corruption of the signal passed onto the Ix pins. If there is no limiting resistor in the switch path, then device damage is possible. A
I7 2 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I6 3 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I5 4 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I4 5 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I3 6 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I2 7 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I1 8 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I0 9 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
S0 10 Address stuck high. Cannot control switch. B
S1 11 Address stuck high. Cannot control switch. B
GND 12 Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. A
S3 13 Address stuck high. Cannot control switch. B
S2 14 Address stuck high. Cannot control switch. B
E/ 15 E/ stuck high. Can no longer disable the device B
I15 16 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I14 17 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I13 18 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I12 19 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I11 20 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I10 21 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I9 22 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
I8 23 Corruption of the signal passed onto the COMMON I/O pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VDD 24 No effect, normal operation. D