SFFS542 October   2022 ISO1640-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 8-D Package
    2. 2.2 16-DW Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 ISO1640-Q1 in 8-D Package
    2. 4.2 ISO1640-Q1 in 16-DW Package

1 Overview

This document contains information for ISO1640-Q1 (8-D and 16-DW packages) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

#GUID-E6E2D3F9-55FB-42A1-95BE-AF298F55DEEF shows the device functional block diagram for reference.

GUID-F158ECE4-5921-4411-B010-8A749F2F2630-low.gifFigure 1-1 Functional Block Diagram

ISO1640-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.