SFFS400 March   2022 TPS3760-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TPS3760-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality
BNo device damage, but loss of functionality
CNo device damage, but performance degradation
DNo device damage, no impact to functionality or performance

Table 4-1 shows the TPS3760-Q1 pin diagram. For a detailed description of the device pins please refer to TPS3760-Q1 in the Pin Configuration and Functions section of the data sheet.

Figure 4-1 Pin Diagram DYY Package14-Pin SOT-23

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

  • RESET are pictured as active low, some configurations (RESET) will be active low. RESET in Figure 4-1 is shown as open-drain, some configurations will be push-pull. Refer to TPS3760-Q1 Pin Configuration and Functions section of the data sheet.
  • At VDD (MIN) ≤ VDD ≤ VDD (MAX), CTR = CTS = Open
  • Output reset Pullup Resistor (RPULLUP) = 10 kΩ, Output reset pullup voltage (VPULLUP = 5.5 V, output reset load (CLOAD) = 10 pF.
  • Tables valid over the operating free-air temperature range of – 40°C to 125°C, unless otherwise noted.
  • Typical values are at TA = 25°C, VDD = 16 V, and VIT = 6.5 V (VIT refers to VITN or VITP) unless stated otherwise.
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
PIN NAME PIN NO. DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) FAILURE EFFECT CLASS
VDD 1

VDD short to GND, Device has no power for normal operation

B

NC

2 Normal operation, Pin is not connected during normal operation D
SENSE 3 Functionality affected, Voltage threshold will not be intended threshold B
NC 4 Normal operation, Pin is not connected during normal operation D
NC 5 Normal operation, Pin is not connected during normal operation D

RESET

6 Functionality affected, Unreliable device output A

NC

7 Normal operation, Pin is not connected during normal operation D
GND 8 Normal operation D
CTR 9 RESET will be asserted. B
CTS 10 Normal operation, RESET will be asserted B
NC

11

Normal operation, Pin is not connected during normal operation D
NC

12

Normal operation, Pin is not connected during normal operation D
GND

13

Normal operation D

NC

14

Normal operation, Pin is not connected during normal operation D
Table 4-3 Pin FMA for Device Pins Open-Circuited
PIN NAME PIN NO. DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) FAILURE EFFECT CLASS
VDD 1 Device Unpowered B

NC

2 Normal operation, Pin is not connected during normal operation D
SENSE 3 Functionality affected, Voltage threshold will not be intended threshold B
NC 4 Normal operation, Pin is not connected during normal operation D
NC 5 Normal operation, Pin is not connected during normal operation D

RESET

6 Functionality affected, Unreliable device output A

NC

7 Normal operation, Pin is not connected during normal operation D
GND 8 Device Unpowered B
CTR 9 Normal operation D
CTS 10 Normal operation D
NC

11

Normal operation, Pin is not connected during normal operation D
NC

12

Normal operation, Pin is not connected during normal operation D
GND

13

Device Unpowered B

NC

14

Normal operation, Pin is not connected during normal operation D
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
PIN NAME PIN NO. SHORTED TO DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) FAILURE EFFECT CLASS
VDD 1

NC

Normal operation D

NC

2 SENSE Normal operation D
SENSE 3 NC Normal operation D
NC 4 NC Normal operation D
NC 5

RESET

Normal operation D

RESET

6

NC

Functionality affected, Unreliable device output. NC is not connected during normal operation. B

NC

7 GND Normal operation D
GND 8 CTR Functionality affected, RESET is asserted B
CTR 9 CTS Functionality affected, Iq can increase B
CTS 10 NC Functionality affected, Iq can increase B
NC

11

NC Functionality affected, Iq can increase C
NC

12

GND Functionality affected, Iq can increase C
GND

13

NC

Normal operation D

NC

14

VDD Normal operation D
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
PIN NAME PIN NO. DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) FAILURE EFFECT CLASS
VDD 1 Normal operation D

NC

2 Normal operation D
SENSE 3 Functionality affected, Voltage threshold will not be intended threshold B
NC 4 Normal operation D
NC 5 Normal operation D

RESET

6 Functionality affected, Can cause short from VDD to GND A

NC

7 Functionality affected, Can cause short from VDD to GND A
GND 8 VDD short to GND Fault B
CTR 9 May damage device if VDD is greater than the pin's recommended operating condition A
CTS 10 May damage device if VDD is greater than the pin's recommended operating condition A
NC

11

May damage device if VDD is greater than the pin's recommended operating condition A
NC

12

May damage device if VDD is greater than the pin's recommended operating condition A
GND

13

VDD short to GND Fault B

NC

14

Normal operation D