SFFS386A april   2022  – april 2023 TPSI3050

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

Failure Mode Distribution (FMD)

The failure mode distribution for TPSI3050 in Table 4-2 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure Modes Failure Mode Distribution (%)
VDDH/VDDM rails fail to power up. VDRV remains low. 15%
VDRV does not respond to EN signaling. 20%
Output power not meeting specification. Longer VDDH/VDDM start-up and recovery times. 25%
VDDH not regulated, potential device damage 15%
VDRV propagation times longer than specified 5%
VDRV only stays high for few microseconds due to improper loading of configuration. 5%
Higher EMI 5%
Unpredictable power down sequence 5%
VDRV output held high 5%