SFFS317A December   2021  – April 2022 BQ77207

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

1 Overview

This document contains information for BQ77207 (DSS package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-20210310-CA0I-SSWG-W0RW-ZDLPRL0CZXBM-low.gif Figure 1-1 Functional Block Diagram

BQ77207 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.