SFFS216 January 2026 TPS22919-Q1
The failure mode distribution estimation for TPS22919-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT stuck on | 25 |
| VOUT open or Hi-Z | 25 |
| VOUT outside specification (voltage or rise time) | 35 |
| QOD stuck on | 5 |
| QOD stuck off | 5 |
| Pin to pin short (any two pins) | 5 |