SFFS090 June 2021 TMUX6219-Q1

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TMUX6219-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to Ground (see Table 4-2)
Pin open-circuited (see Table 4-3)
Pin short-circuited to an adjacent pin (see Table 4-4)
Pin short-circuited to supply (see Table 4-5)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality
B	No device damage, but loss of functionality
C	No device damage, but performance degradation
D	No device damage, no impact to functionality or performance

Figure 4-1 shows the TMUX6219-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TMUX6219-Q1 data sheet.

Figure 4-1 Pin Diagram

Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
D	1	Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible.	A
S1	2	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A
GND	3	There is no effect; this is normal operation.	D
VDD	4	Device is unpowered and not functional.	B
EN	5	Enable is stuck low. Can no longer turn off the device.	B
IN	6	Address is stuck low. Cannot control switch states.	B
VSS	7	There is no effect; this is normal operation, if the switch path signal voltages are positive. Possible damage to the device if the switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
S2	8	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A

Table 4-3 Pin FMA for Device Pins Open-Circuited

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
D	1	Corruption of the signal passed onto the S pins.	B
S1	2	Corruption of the signal passed onto the D pin.	B
GND	3	Device is unpowered and not functional.	B
VDD	4	Device is unpowered and not functional.	B
EN	5	Loss of control of the EN pin. Cannot turn off the device.	B
IN	6	Loss of control of the address pin. Cannot control the switch.	B
VSS	7	Device is unpowered and not functional.	B
S2	8	Corruption of the signal passed onto the D pin.	B

Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin

Pin Name	Pin No.	Shorted to	Description of Potential Failure Effect(s)	Failure Effect Class
D	1	S1	Possible corruption of the signal passed onto the SX and D pin.	B
S1	2	GND	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A
GND	3	VDD	Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
VDD	4	EN	Not considered. This is a corner pin.	D
EN	5	IN	Loss of control of the switch state.	B
IN	6	VSS	Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
VSS	7	S2	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A
S2	8	D	Not considered. This is a corner pin.	D

Table 4-5 Pin FMA for Device Pins Short-Circuited to VDD

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
D	1	Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible	A
S1	2	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A
GND	3	Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
VDD	4	There is no effect; this is normal operation.	D
EN	5	Enable is stuck high. Can no longer turn off the device	B
IN	6	Address is stuck high. Cannot control the switch states.	B
VSS	7	Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
S2	8	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A

Table 4-6 Pin FMA for Device Pins Short-Circuited to VSS

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
D	1	Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible.	A
S1	2	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A
GND	3	Controls are stuck high. Can no longer turn off the device	B
VDD	4	Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
EN	5	Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
IN	6	Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.	A
VSS	7	There is no effect; this is normal operation.	D
S2	8	Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible.	A