SDAA418 June   2026 UCC5880-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction Background
    1. 1.1 Functional Requirements
    2. 1.2 Main Features of UCC5880-Q1
    3. 1.3 SW Configuration Mode Detection Process
    4. 1.4 Key Configuration Parameters
  5. 2Test Results
  6. 3Summary
  7. 4References

2 Test Results

This section summarizes the experimental waveform of DS short‑fault detection based on the UCC5880-Q1 Iso gate driver IC. The test waveform reflect that the UCC5880 can accurately detect drain‑source short‑circuit events within the expected time window.

Without DS Short Test WaveformFigure 2-1 Without DS Short Test Waveform
With DS Short Test WaveformFigure 2-2 With DS Short Test Waveform