SDAA385 June   2026 TCA9617B

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Failure Analysis
    1. 2.1 Original ICT Setup
    2. 2.2 Corrective Actions
    3. 2.3 Validation Result
    4. 2.4 Recommendations
  6. 3Summary
  7. 4References

Validation Result

After implementing the updated ICT setup, waveform integrity improved significantly. The worst-case overshoot decreased from 8.62 V to 3.54 V, while the worst-case undershoot improved from -4.28 V to -0.35 V. All measured voltages were now within the datasheet absolute maximum specifications of the device. There exists no more pedestal contention.

Oscilloscope measurements also confirmed that ringing amplitude and transient spike energy were substantially reduced. Following implementation of the new ICT method and the addition of series resistors, no additional I/O damage or stuck-low conditions were observed during production testing.

Table 2-2 Before and After Measurements
Parameter Measured Value (Before ICT changes) Measured Value (After ICT changes) Datasheet Limit
Overshoot 8.62V 3.54V 6.5V
Undershoot -4.28V -0.35V -0.5V