SCLK035 December   2023 SN54SC3T97-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

1.1 Device Details

Table 1-1 lists the device information used for TID HDR Radiation Lot Acceptance Testing (RLAT).

Table 1-1 Device and Exposure Details
TID HDR Details: up to 30 krad(Si)
TI Device NumberSN54SC3T97-SEP
Package14-pin PW (TSSOP)
TechnologyLBC9
Die Lot Number3059497RFB
A/T Lot Number and Date Code3632644ML3 / 36AEQPK
Quantity Tested12 irradiated devices + 4 control
Lot Accept or RejectDevices passed 30 krad(Si)
HDR Radiation FacilityTexas Instruments CLAB in Dallas, Texas
HDR Dose Level30 krad(Si)
HDR Dose Rate196.01 -rad(Si)/s ionizing radiation
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature