ZHCSHJ8C December   2017  – November 2019 TVS0500

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      封装比较
      2.      对 8/20µs 浪涌事件的电压钳位响应
  4. 修订历史记录
  5. Device Comparison Table
  6. Pin Configuration and Functions
    1.     Pin Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings - JEDEC
    3. 7.3 ESD Ratings - IEC
    4. 7.4 Recommended Operating Conditions
    5. 7.5 Thermal Information
    6. 7.6 Electrical Characteristics
    7. 7.7 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Reliability Testing
    5. 8.5 Device Functional Modes
      1. 8.5.1 Protection Specifications
      2. 8.5.2 Minimal Derating
      3. 8.5.3 Transient Performance
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Configuration Options
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 接收文档更新通知
    2. 12.2 社区资源
    3. 12.3 商标
    4. 12.4 静电放电警告
    5. 12.5 Glossary
  13. 13机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Typical Characteristics

TVS0500 D001_SLVSED2.gif
Figure 1. 8/20 µs Surge Response at 43 A
TVS0500 D003_SLVSED2.gif
f = 1 MHz, 30 mVpp, IO to GND
Figure 3. Capacitance vs Temperature Across Bias
TVS0500 D005_SLVSED2.gif
Figure 5. I/V Curve Across Temperature
TVS0500 D007_SLVSED2.gif
Figure 7. Breakdown Voltage (1 mA) vs Temperature
TVS0500 D009_SLVSED2.gif
Figure 9. Dynamic Leakage vs Signal Slew Rate across Temperature
TVS0500 D002_SLVSED2.gif
Figure 2. 8/20 µs Surge Response at 35 A Across Temperature
TVS0500 D004_SLVSED2.gif
Figure 4. Leakage Current vs Temperature at 5 V
TVS0500 D006_SLVSED2.gif
Figure 6. Forward Voltage vs Temperature
TVS0500 D008_SLVSED2.gif
Figure 8. Max Surge Current (8/20 µs) vs Temperature