ZHCSHH0B January   2018  – July 2018 TLV6713

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      典型应用
  4. 修订历史记录
  5. Device Comparison Table
  6. Pin Configuration and Functions
    1.     Pin Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Input Pin (SENSE)
      2. 8.3.2 Output Pin (OUT)
    4. 8.4 Device Functional Modes
      1. 8.4.1 Normal Operation (VDD > UVLO)
      2. 8.4.2 Undervoltage Lockout (V(POR) < VDD < UVLO)
      3. 8.4.3 Power On Reset (VDD < V(POR))
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Input and Output Configurations
      2. 9.1.2 Immunity to Input Pin Voltage Transients
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Resistor Divider Selection
        2. 9.2.2.2 Pullup Resistor Selection
        3. 9.2.2.3 Input Supply Capacitor
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 开发支持
    2. 12.2 接收文档更新通知
    3. 12.3 社区资源
    4. 12.4 商标
    5. 12.5 静电放电警告
    6. 12.6 术语表
  13. 13机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Thermal Information

THERMAL METRIC (1) TLV6713 UNIT
DDC (SOT-23)
6 PINS
RθJA Junction-to-ambient thermal resistance 201.6 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 47.8 °C/W
RθJB Junction-to-board thermal resistance 51.2 °C/W
ψJT Junction-to-top characterization parameter 0.7 °C/W
ψJB Junction-to-board characterization parameter 50.8 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.