SNOSD57 June   2017 LF298-MIL

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 Recommended Operating Conditions
    3. 6.3 Thermal Information
    4. 6.4 Electrical Characteristics
    5. 6.5 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 TTL and CMOS 3 V ≤ VLOGIC (Hi State) ≤ 7 V
    2. 7.2 CMOS 7 V ≤ VLOGIC (Hi State) ≤ 15 V
    3. 7.3 Operational Amplifier Drive
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Hold Capacitor
      2. 9.1.2 DC and AC Zeroing
      3. 9.1.3 Logic Rise Time
      4. 9.1.4 Sampling Dynamic Signals
      5. 9.1.5 Digital Feedthrough
    2. 9.2 Typical Applications
      1. 9.2.1  X1000 Sample and Hold
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2  Sample and Difference Circuit
      3. 9.2.3  Ramp Generator With Variable Reset Level
      4. 9.2.4  Integrator With Programmable Reset Level
      5. 9.2.5  Output Holds at Average of Sampled Input
      6. 9.2.6  Increased Slew Current
      7. 9.2.7  Reset Stabilized Amplifier
      8. 9.2.8  Fast Acquisition, Low Droop Sample and Hold
      9. 9.2.9  Synchronous Correlator for Recovering Signals Below Noise Level
      10. 9.2.10 2-Channel Switch
      11. 9.2.11 DC and AC Zeroing
      12. 9.2.12 Staircase Generator
      13. 9.2.13 Differential Hold
      14. 9.2.14 Capacitor Hysteresis Compensation
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

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12 Device and Documentation Support

12.1 Device Support

12.1.1 Device Nomenclature

  • Hold Step: The voltage step at the output of the sample and hold when switching from sample mode to hold mode with a steady (DC) analog input voltage. Logic swing is 5 V.
  • Acquisition Time: The time required to acquire a new analog input voltage with an output step of 10 V. Acquisition time is not just the time required for the output to settle, but also includes the time required for all internal nodes to settle so that the output assumes the proper value when switched to the hold mode.
  • Gain Error: The ratio of output voltage swing to input voltage swing in the sample mode expressed as a per cent difference.
  • Hold Settling Time: The time required for the output to settle within 1 mV of final value after the hold logic command.
  • Dynamic Sampling Error: The error introduced into the held output due to a changing analog input at the time the hold command is given. Error is expressed in mV with a given hold capacitor value and input slew rate. This error term occurs even for long sample times.
  • Aperture Time: The delay required between hold command and an input analog transition, so that the transition does not affect the held output.

12.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

12.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

12.4 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

12.5 Electrostatic Discharge Caution

esds-image

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

12.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.