4 Revision History
Changes from Revision D (October 2020) to Revision E (August 2023)
- 将整个文档中的标准名称从“DIN V VDE V 0884-11:2017-01”更改为“DIN EN IEC 60747-17 (VDE 0884-17)”Go
- 通篇删除了所有标准名称中的标准版本和年份参考Go
- Updated Thermal Characteristics, Safety Limiting Values, and Thermal
Derating Curves to provide more accurate system-level thermal
calculationsGo
- Updated electrical and switching characteristics to match device
performanceGo
- Changed working voltage lifetime margin from: 87.5% to: 50%, minimum
required insulation lifetime from: 37.5 years to: 30 years and insulation
lifetime per TDDB from: 135 years to: 169 years per DIN EN IEC 60747-17 (VDE
0884-17)Go
- Changed Figure 9-8 per DIN EN
IEC 60747-17 (VDE 0884-17Go
Changes from Revision C (March 2020) to Revision D (October 2020)
Changes from Revision B (September 2018) to Revision C (March 2020)
- 通篇进行了编辑性和修饰性更改Go
- 将“隔离栅寿命:超过 40 年”更改为“在 1500VRMS 工作电压下预计寿命超过 100 年”(位于节 1)Go
- 在节 1中添加了“隔离等级高达 5000VRMS”Go
- 在节 1中添加了“浪涌能力高达 12.8kV”Go
- 在节 1中添加了“在整个隔离栅具有 ±8kV IEC 61000-4-2 接触放电保护”Go
- 将 UL 认证要点从“符合 UL 1577 的 5000VRMS (DW) 和 2500VRMS (DBQ) 隔离额定值”更改为“UL 1577 组件认证计划”(在节 1中)Go
- 删除了节 1中的“除 DBQ-16 封装器件的 CQC 认证外,所有认证均已完成”要点Go
- 更新了节 2部分的应用列表Go
- 更新了图 3-1,以便显示每个通道的两个串联隔离电容器,而不是单个隔离电容器Go
- Added "Contact discharge per IEC 61000-4-2" specification of ±8000 V in Section 6.2 tableGo
- Added the following table note to Data rate specification in Section 6.3 table: "100 Mbps is the maximum specified data rate, although higher data rates are possible." Go
- Changed VIORM value for DW-16 package From: "1414 VPK" To: "2121 VPK" in Section 6.6 table Go
- Changed VIOWM value for DW-16 package AC voltage From: "1000 VRMS" To: "1500 VRMS" and DC voltage From: "1414 VDC" To: "2121 VDC" in Section 6.6 table Go
- Added 'see Figure 9-8' to TEST CONDITIONS of VIOWM specification in Section 6.6
Go
- Changed VIOSM TEST CONDITIONS From: "Test method per IEC 60065" To: "Test method per IEC 62368-1" in Section 6.6 tableGo
- Updated certification information in Section 6.7 table Go
- Corrected ground symbols for "Input (Devices with F suffix)" in Section 8.4.1
Go
- Added Section 9.2.3.1 sub-section under Section 9.2.3 sectionGo
- Added 'How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems' application report to Section 12.1 section Go
Changes from Revision A (May 2017) to Revision B (June 2018)
- 通篇更改了 DIN 认证编号和认证状态Go
- 将 DBQ 封装的隔离等级从 2500VRMS 更改为 3000VRMS
Go
- Moved the HBM and CDM values from the Features section to the ESD Ratings tableGo
- Added VTEST to the conditions for the maximum transient isolation voltage parameter in the Insulation Specifications tableGo
- Changed the value for the DBQ package from 3600 VPK to 4242 VPK throughout the documentGo
- Changed the method b1 Vini condition for apparent charge in the Insulation Specifications tableGo
Changes from Revision * (November 2016) to Revision A (May 2017)
- Updated the Safety-Related Certifications tableGo
- Changed the minimum CMTI from 40 to 85 in all Electrical Characteristics tables Go