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  • AM64x/AM243x Extended Power-On Hours

    • SPRAD52 August   2022 AM2431 , AM2432 , AM2434 , AM6411 , AM6412 , AM6421 , AM6422 , AM6441 , AM6442

       

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  • AM64x/AM243x Extended Power-On Hours
  1.   AM574x Extended Power-On Hours (POH)
  2.   Trademarks
  3. 1Introduction
  4. 2Wear-Out Mechanisms
  5. 3Guidelines for Extended POH
  6. 4Summary
  7. 5References
  8. IMPORTANT NOTICE
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APPLICATION NOTE

AM64x/AM243x Extended Power-On Hours

1 AM574x Extended Power-On Hours (POH)

This application report provides guidelines for extending the operational lifetime of an AM64x and AM243x device from 100k Power-On Hours (POH) up to 200k POH. The data provided are operational lifetime estimates and do not ensure the lifetime of the device.

Trademarks

All trademarks are the property of their respective owners.

1 Introduction

Many industrial applications require systems to operate 24 hours a day and seven days a week for several years. To keep those industrial systems in operation, it is important to be able to predict the wear-out of the systems so the equipment can be serviced and maintained to try to prevent a failure during normal operation. The semiconductor devices that are designed into those systems have typically been expected to reach estimated lifetimes of 100k POH at maximum junction temperature (Tj). Now, with a demand for reduced maintenance, industrial systems must meet even longer operational lifetimes. To help facilitate this at the semiconductor component level, this document details the requirements and limitations to extend the estimated operational lifetime of the AM64x processor and AM243x microcontroller from 100k POH up to 200k POH.

2 Wear-Out Mechanisms

Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime of TI embedded processors under power when used in electronic systems. It discusses the stages of reliability, the useful life period, and complementary metal-oxide semiconductor (CMOS) wear-out mechanisms. The primary wear-out mechanism discussed in the application note was electro-migration.

As each semiconductor process node is unique, some wear-out mechanism may affect the estimated lifetime of the devices in different ways.

For the AM64x/AM243x, the following CMOS wear-out mechanisms were evaluated to extend the estimated operational lifetime of the device:

  • Electro-Migration
  • Gate Oxide Integrity
  • Negative Bias Temperature Instability
  • Channel Hot Carrier

The guidelines detailed in the next section were generated as a result of that evaluation.

3 Guidelines for Extended POH

For extended POH up to 200k POH (greater than 20 years), the same notes apply as listed for 100k POH in the Power-On Hours (POH) section in the AM64x Sitara™ Processors Data Manual and in the Power-On Hours (POH) section in the AM243x Sitara™ Microcontrollers Data Manual.

As noted in the data manuals, AM64x and AM243x achieve an estimated 100k POH with Tj in industrial temperature range of -40°C to 105°C.

Extended POH estimates up to 200k POH are stated in Figure 3-1 for continuous processor operation. An estimated 200k POH can be targeted for systems by maintaining Tj in range of ‐20°C to 85°C. Note that there are estimates from 100k and 200k POH between 105°C and 85°C and between -40°C and -20°C, respectively, that can be utilized for extended lifetime profiling as well.

Figure 3-1 Extended Power-On Hour Estimates Over Junction Temperature

 

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