SFFS875 April   2024 SN74AVC4T245-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TSSOP Package
    2. 2.2 WQFN Package
    3. 2.3 UQFN Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TSSOP Package
    2. 4.2 WQFN Package
    3. 4.3 UQFN Package

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for SN74AVC4T245-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
Driver HIZ; no output18%
Output functional – out of specification timing or voltage27%
Driver stuck at fault high21%
Driver stuck at fault low24%
Driver stuck at undetermined state10%