SFFS619 December   2023 MSPM0L1304-Q1 , MSPM0L1305-Q1 , MSPM0L1306-Q1

 

  1.   1
  2. 1Introduction
    1.     Trademarks
  3. 2MSPM0L Hardware Component Functional Safety Capability
  4. 3Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
    2. 3.2 TI Functional Safety Development Process
  5. 4MSPM0L Component Overview
    1. 4.1 Targeted Applications
    2. 4.2 Hardware Component Functional Safety Concept
    3. 4.3 Functional Safety Constraints and Assumptions
  6. 5Description of Hardware Component Parts
    1. 5.1  ADC
    2. 5.2  Comparator
    3. 5.3  OPA
    4. 5.4  CPU
    5. 5.5  RAM
    6. 5.6  FLASH
    7. 5.7  GPIO
    8. 5.8  DMA
    9. 5.9  SPI
    10. 5.10 I2C
    11. 5.11 UART
    12. 5.12 Timers (TIMx)
    13. 5.13 PMU
    14. 5.14 CKM
  7. 6MSPM0L Management of Random Faults
    1. 6.1 Fault Reporting
    2. 6.2 Functional Safety Mechanism Categories
    3. 6.3 Description of Functional Safety Mechanisms
      1. 6.3.1  ADC1,DMA1,COMP1,GPIO2,TIM2,I2C2,IOMUX1,OA1,SPI2,UART2,SYSCTL5,REF1: Periodic read of static configuration registers
      2. 6.3.2  ADC2: Software test of function
      3. 6.3.3  ADC3: ADC trigger overflow check
      4. 6.3.4  ADC4: Window comparator
      5. 6.3.5  OA2: Test of OA using internal DAC8 as a driver
      6. 6.3.6  COMP3: Testing COMP using an external pin
      7. 6.3.7  CPU1: CPU test using software test library
      8. 6.3.8  DMA2: Software test of DMA function
      9. 6.3.9  SYSMEM1: Write to SRAM from CPU, read from DMA
      10. 6.3.10 SYSMEM2: Write to SRAM from DMA, read from CPU
      11. 6.3.11 SYSMEM5: SRAM March test
      12. 6.3.12 FXBAR1: CPU readback of known data from Flash
      13. 6.3.13 FXBAR2: DMA readback of known data from Flash
      14. 6.3.14 FLASH2: CRC check of flash content
      15. 6.3.15 GPIO1: GPIO test using pin IO loopback
      16. 6.3.16 WDT
      17. 6.3.17 TIM1: Software test of function
      18. 6.3.18 I2C1: Software test of I2C function using internal loopback mechanism
      19. 6.3.19 SPI1 : Software test of SPI function
      20. 6.3.20 SPI3: SPI periodic safety message exchange
      21. 6.3.21 UART1: Software test of UART function
      22. 6.3.22 SYSCTL1: MCLK monitor
      23. 6.3.23 SYSCTL8: Brownout Reset (BOR) Supervisor
      24. 6.3.24 SYSCTL9: FCC counter logic to calculate clock frequencies
      25. 6.3.25 SYSCTL10: External voltage monitor
      26. 6.3.26 SYSCTL11: Boot process monitor
      27. 6.3.27 SYSCTL12: Shutdown memory bits parity protection
      28. 6.3.28 SYSCTL14: Brownout Voltage Monitor
      29. 6.3.29 SYSCTL15: External voltage supervisor on VDD
      30. 6.3.30 REF2: Test of VREF using ADC
  8.   A Summary of Recommended Functional Safety Mechanism Usage
  9.   B Distributed Developments
    1.     B.1 How the Functional Safety Lifecycle Applies to TI Functional Safety Products
    2.     B.2 Activities Performed by Texas Instruments
    3.     B.3 Information Provided
  10.   C Revision History

5.14 CKM

The clock module provides the following oscillators:

  • LFOSC: Internal low-frequency oscillator (32 kHz)
  • SYSOSC: Internal high-frequency oscillator (4 MHz or 32 MHz with factory trim, 16 MHz or 24 MHz with user trim)

The following clocks are distributed by the clock module for use by the processor, bus, and peripherals:

  • MCLK: Main system clock for PD1 peripherals, derived from SYSOSC or LFCLK, active in RUN and SLEEP modes
  • CPUCLK: Clock for the processor (derived from MCLK), active in RUN mode
  • ULPCLK: Ultra-low power clock for PD0 peripherals, active in RUN, SLEEP, STOP, and STANDBY modes
  • MFCLK: 4-MHz fixed mid-frequency clock for peripherals, available in RUN, SLEEP, and STOP modes
  • LFCLK: 32-kHz fixed low-frequency clock for peripherals or MCLK, active in RUN, SLEEP, STOP, and STANDBY modes
  • ADCCLK: ADC clock, available in RUN, SLEEP and STOP modes
  • CLK_OUT: Used to output a clock externally, available in RUN, SLEEP, STOP, and STANDBY modes

For more details, see the CKM chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

The following tests can be applied as functional safety mechanisms for this module (to provide diagnostic coverage on a specific function):