SFFS242 April   2022 PCA9306-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the PCA9306-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality
BNo device damage, but loss of functionality
CNo device damage, but performance degradation
DNo device damage, no impact to functionality or performance

Figure 4-1 shows the PCA9306-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the PCA9306-Q1 data sheet.

Figure 4-1 Pin Diagram
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
GND1Normal operation, no effect.D
VREF12Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings.A
SCL13Clock line stuck low, loss of communication.B
SDA14Data line stuck low, loss of communication.B
SDA25Data line stuck low, loss of communication.B
SCL26Clock line stuck low, loss of communication.B
VREF27No effect, normal operation if switch path signal voltages are positive. Possible damage to device if switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible.A
EN8Loss of communcation, unable to turn device on.A
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
GND 1 Potential for data corruption. Loss of level translation functionality. B
VREF1 2 Potential for data corruption. Loss of level translation functionality. B
SCL1 3 Loss of communication B
SDA1 4 Loss of communication. B
SDA2 5 Loss of communication. B
SCL2 6 Loss of communication. B
VREF2 7 Potential for data corruption. Loss of level translation functionality. B
EN 8 Potential for data corruption. Loss of level translation functionality. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
GND1VREF1Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings.A
VREF12SCL1Clock line stuck high, loss of communication.B
SCL13SDA1Communication will be corrupted, clock and data shorted together.B
SDA14SDA2Not considered. This is a corner pin.D
SDA25SCL2Communication will be corrupted, clock and data shorted together.B
SCL26VREF2Clock line stuck high, loss of communication.B
VREF27ENNormal operation if operated as a level translation device. Unable to disable device if operated as a switch.B
EN8GNDNot considered. This is a corner pin.D
Table 4-5 Pin FMA for Device Pins Short-Circuited to supply (VREF1)
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
GND1Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings.A
VREF12Normal operation, no effect.D
SCL13Clock line stuck high, loss of communication.B
SDA14Clock line stuck high, loss of communication.B
SDA25Clock line stuck high, loss of communication.B
SCL26Clock line stuck high, loss of communication.B
VREF27Potential for data corruption. Loss of level translation functionality.B
EN8Potential for data corruption. Loss of level translation functionality.B
Table 4-6 Pin FMA for Device Pins Short-Circuited to supply (VREF2)
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
GND 1 Communication will be corrupted and possibly cut off. Potential high current draw, and device damage if current is outside of absolute maximum ratings. A
VREF1 2 Loss of level translation functionality. B
SCL1 3 Clock line stuck high, loss of communication. B
SDA1 4 Clock line stuck high, loss of communication. B
SDA2 5 Clock line stuck high, loss of communication. B
SCL2 6 Clock line stuck high, loss of communication. B
VREF2 7 Normal operation, no effect. D
EN 8 Normal operation if operated as a level translation device. Unable to disable device if operated as a switch. B