SCLK034 December   2023 SN54SC2T74-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

Abstract

This report covers the radiation characterization results of the SN54SC2T74-SEP radiation tolerant, dual D-type flip-flop with integrated translation. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 50 krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 50 krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using 5 units at a dose level of 30 krad(Si) for future wafer lots per MIL-STD-883 TM 1019.

The SN54SC2T74-SEP is packaged in a space enhanced plastic package for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg, which makes the device an option for low Earth orbit space applications. Single Event Transient (SET) data is also provided in the Single Event Effects Radiation Report.