ZHCSH19F November   2017  – November 2023 TCAN1043-Q1 , TCAN1043G-Q1 , TCAN1043H-Q1 , TCAN1043HG-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 ESD Ratings IEC Specification
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Thermal Information
    6. 6.6 Dissipation Ratings
    7. 6.7 Electrical Characteristics
    8. 6.8 Switching Characteristics
    9. 6.9 Typical Characteristics
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Internal and External Indicator Flags (nFAULT and RXD)
      2. 8.3.2 Power-Up Flag (PWRON)
      3. 8.3.3 Wake-Up Request Flag (WAKERQ)
      4. 8.3.4 Wake-Up Source Recognition Flag (WAKESR)
      5. 8.3.5 Undervoltage Fault Flags
        1. 8.3.5.1 Undervoltage on VCC Fault
        2. 8.3.5.2 Undervoltage on VIO Fault
        3. 8.3.5.3 Undervoltage on VSUP Fault
      6. 8.3.6 CAN Bus Failure Fault Flag
      7. 8.3.7 Local Faults
        1. 8.3.7.1 TXD Dominant Timeout (TXD DTO)
        2. 8.3.7.2 TXD Shorted to RXD Fault
        3. 8.3.7.3 CAN Bus Dominant Fault
        4. 8.3.7.4 Thermal Shutdown (TSD)
        5. 8.3.7.5 RXD Recessive Fault
        6. 8.3.7.6 Undervoltage Lockout (UVLO)
        7. 8.3.7.7 Unpowered Device
        8. 8.3.7.8 Floating Terminals
        9. 8.3.7.9 CAN Bus Short Circuit Current Limiting
    4. 8.4 Device Functional Modes
      1. 8.4.1 CAN Bus States
      2. 8.4.2 Normal Mode
      3. 8.4.3 Silent Mode
      4. 8.4.4 Standby Mode
      5. 8.4.5 Go-to-Sleep Mode
      6. 8.4.6 Sleep Mode with Remote Wake and Local Wake Up Requests
        1. 8.4.6.1 Remote Wake Request via Wake Up Pattern (WUP)
        2. 8.4.6.2 Local Wake Up (LWU) via WAKE Input Terminal
      7. 8.4.7 Driver and Receiver Function Tables
      8. 8.4.8 Digital Inputs and Outputs
      9. 8.4.9 INH (Inhibit) Output
  10. 9 Application Information Disclaimer
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
        1. 9.2.1.1 Bus Loading, Length and Number of Nodes
      2. 9.2.2 Detailed Design Procedures
        1. 9.2.2.1 CAN Termination
      3. 9.2.3 Application Curves
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout
        1. 9.4.1.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 支持资源
    3. 10.3 商标
    4. 10.4 静电放电警告
    5. 10.5 术语表
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

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10.4 静电放电警告

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif 静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序，可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级，大至整个器件故障。精密的集成电路可能更容易受到损坏，这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。