ZHCSLO1D
September 1988 – February 2021
SN74BCT374
PRODUCTION DATA
1
特性
2
应用
3
说明
4
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings (1)
6.2
ESD Ratings
6.3
Recommended Operating Conditions (1)
6.4
Thermal Information
6.5
Electrical Characteristics
6.6
Timing Requirements
6.7
Switching Characteristics
6.8
Typical Characteristics
7
Parameter Measurement Information
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Bipolar Push-Pull Outputs
8.3.2
Standard CMOS Inputs
8.3.3
Clamp Diode Structure
8.4
Device Functional Modes
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Application
9.2.2
Design Requirements
9.2.2.1
Power Considerations
9.2.2.2
Output Considerations
9.2.2.3
Input Considerations
9.2.3
Detailed Design Procedure
9.2.4
Application Curves
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
Documentation Support
12.1.1
Related Documentation
12.2
接收文档更新通知
12.3
支持资源
12.4
Trademarks
12.5
静电放电警告
12.6
术语表
13
Mechanical, Packaging, and Orderable Information
封装选项
请参考 PDF 数据表获取器件具体的封装图。
机械数据 (封装 | 引脚)
NS|20
N|20
DW|20
散热焊盘机械数据 (封装 | 引脚)
订购信息
zhcslo1d_oa
zhcslo1d_pm
12.5
静电放电警告
静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。