ZHCSAU2G September   2012  – June 2018 SN65DSI84

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     典型应用
  4. 4 修订历史记录
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 EDS Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Clock Configurations and Multipliers
      2. 7.3.2 ULPS
      3. 7.3.3 LVDS Pattern Generation
    4. 7.4 Device Functional Modes
      1. 7.4.1 Reset Implementation
      2. 7.4.2 Initialization Sequence
      3. 7.4.3 LVDS Output Formats
      4. 7.4.4 DSI Lane Merging
      5. 7.4.5 DSI Pixel Stream Packets
      6. 7.4.6 DSI Video Transmission Specifications
      7. 7.4.7 Operating Modes
    5. 7.5 Programming
      1. 7.5.1 Local I2C Interface Overview
    6. 7.6 Register Maps
      1. 7.6.1 Control and Status Registers Overview
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Video Stop and Restart Sequence
      2. 8.1.2 Reverse LVDS Pin Order Option
      3. 8.1.3 IRQ Usage
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Example Script
      3. 8.2.3 Application Curve
  9. 9 Power Supply Recommendations
    1. 9.1 VCC Power Supply
    2. 9.2 VCORE Power Supply
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Package Specific
      2. 10.1.2 Differential Pairs
      3. 10.1.3 Ground
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 接收文档更新通知
    2. 11.2 社区资源
    3. 11.3 商标
    4. 11.4 静电放电警告
    5. 11.5 术语表
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.3.3 LVDS Pattern Generation

The SN65DSI84 supports a pattern generation feature on LVDS Channels. This feature can be used to test the LVDS output path and LVDS panels in a system platform. The pattern generation feature can be enabled by setting the CHA_TEST_PATTERN bit at address 0x3C. No DSI data is received while the pattern generation feature is enabled.

There are three modes available for LVDS test pattern generation. The mode of test pattern generation is determined by register configuration as shown in Table 1.

Table 1. Video Registers

Addr. bit Register Name
0x20.7:0 CHA_ACTIVE_LINE_LENGTH_LOW
0x21.3:0 CHA_ACTIVE_LINE_LENGTH_HIGH
0x24.7:0 CHA_VERTICAL_DISPLAY_SIZE_LOW
0x25.3:0 CHA_VERTICAL_DISPLAY_SIZE_HIGH
0x2C.7:0 CHA_HSYNC_PULSE_WIDTH_LOW
0x2D.1:0 CHA_HSYNC_PULSE_WIDTH_HIGH
0x30.7:0 CHA_VSYNC_PULSE_WIDTH_LOW
0x31.1:0 CHA_VSYNC_PULSE_WIDTH_HIGH
0x34.7:0 CHA_HORIZONTAL_BACK_PORCH
0x36.7:0 CHA_VERTICAL_BACK_PORCH
0x38.7:0 CHA_HORIZONTAL_FRONT_PORCH
0x3A.7:0 CHA_VERTICAL_FRONT_PORCH