ZHCSKF3B April   2017  – October 2019 LMH0397

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     简化方框图
  4. 4 修订历史记录
  5. 5 说明 （续）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Recommended SMBus Interface Timing Specifications
    7. 7.7 Serial Parallel Interface (SPI) Timing Specifications
    8. 7.8 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
      1. 8.1.1 Equalizer Mode (EQ Mode)
      2. 8.1.2 Cable Driver Mode (CD Mode)
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  4-Level Input Pins and Thresholds
      2. 8.3.2  Equalizer (EQ) and Cable Driver (CD) Mode Control
        1. 8.3.2.1 EQ/CD_SEL Control
        2. 8.3.2.2 OUT0_SEL and SDI_OUT_SEL Control
      3. 8.3.3  Input Carrier Detect
      4. 8.3.4  –6-dB Splitter Mode Launch Amplitude for SDI_IO+ (EQ Mode Only)
      5. 8.3.5  Continuous Time Linear Equalizer (CTLE)
        1. 8.3.5.1 Line-Side Adaptive Cable Equalizer (SDI_IO+ in EQ Mode)
        2. 8.3.5.2 Host-Side Adaptive PCB Trace Equalizer (IN0± in CD Mode)
      6. 8.3.6  Clock and Data (CDR) Recovery
      7. 8.3.7  Internal Eye Opening Monitor (EOM)
      8. 8.3.8  Output Function Control
      9. 8.3.9  Output Driver Control
        1. 8.3.9.1 Line-Side Output Cable Driver (SDI_IO+ in CD Mode, SDI_OUT+ in EQ or CD Mode)
          1. 8.3.9.1.1 Output Amplitude (VOD)
          2. 8.3.9.1.2 Output Pre-Emphasis
          3. 8.3.9.1.3 Output Slew Rate
          4. 8.3.9.1.4 Output Polarity Inversion
        2. 8.3.9.2 Host-Side 100-Ω Output Driver (OUT0± in EQ or CD Mode)
      10. 8.3.10 Status Indicators and Interrupts
        1. 8.3.10.1 LOCK_N (Lock Indicator)
        2. 8.3.10.2 CD_N (Carrier Detect)
        3. 8.3.10.3 INT_N (Interrupt)
      11. 8.3.11 Additional Programmability
        1. 8.3.11.1 Cable EQ Index (CEI)
        2. 8.3.11.2 Digital MUTEREF
    4. 8.4 Device Functional Modes
      1. 8.4.1 System Management Bus (SMBus) Mode
        1. 8.4.1.1 SMBus Read and Write Transaction
          1. 8.4.1.1.1 SMBus Write Operation Format
          2. 8.4.1.1.2 SMBus Read Operation Format
      2. 8.4.2 Serial Peripheral Interface (SPI) Mode
        1. 8.4.2.1 SPI Read and Write Transactions
        2. 8.4.2.2 SPI Write Transaction Format
        3. 8.4.2.3 SPI Read Transaction Format
        4. 8.4.2.4 SPI Daisy Chain
    5. 8.5 Register Maps
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 SMPTE Requirements and Specifications
      2. 9.1.2 Low-Power Optimization in CD Mode
    2. 9.2 Typical Applications
      1. 9.2.1 Bidirectional I/O
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 Cable Equalizer With Loop-Through
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
        3. 9.2.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Board Stack-Up and Ground References
      2. 11.1.2 High-Speed PCB Trace Routing and Coupling
        1. 11.1.2.1 SDI_IO± and SDI_OUT±
        2. 11.1.2.2 IN0± and OUT0±
      3. 11.1.3 Anti-Pads
      4. 11.1.4 BNC Connector Layout and Routing
      5. 11.1.5 Power Supply and Ground Connections
      6. 11.1.6 Footprint Recommendations
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 开发支持
    2. 12.2 文档支持
      1. 12.2.1 相关文档
    3. 12.3 接收文档更新通知
    4. 12.4 支持资源
    5. 12.5 商标
    6. 12.6 静电放电警告
    7. 12.7 出口管制提示
    8. 12.8 Glossary
  13. 13机械、封装和可订购信息
    1. 13.1 Package Option Addendum
      1. 13.1.1 Packaging Information
      2. 13.1.2 Tape and Reel Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

12.6 静电放电警告

esds-image

ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可能会损坏集成电路。

ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。