TLE2142
- Low noise
- 10Hz . . . 15nV/√ Hz
- 1kHz . . . 10.5nV/√ Hz
- Load capability: 10000pF
- Short-circuit output current: 20mA (minimum)
- Slew rate: 27V/µs (minimum)
- High gain-bandwidth product: 5.9MHz
- Low VIO: 500µV maximum at 25°C
- Single or split supply: 4V to 44V
- Fast settling time:
- 340ns to 0.1%
- 400ns to 0.01%
- Saturation recovery: 150ns
- Large output swing:
- VCC− + 0.1V to VCC+ − 1V
The TLE214x and TLE214xA devices are high-performance, internally compensated operational amplifiers built using Texas Instruments complementary bipolar Excalibur process. The TLE214xA is a tighter offset voltage grade of the TLE214x. Both are pin-compatible upgrades to standard industry products.
The design incorporates an input stage that simultaneously achieves low audio-band noise of 10.5nV/√ Hz with a 10Hz 1/f corner and symmetrical 40V/µs slew rate typically with loads up to 800pF. The resulting low distortion and high power bandwidth are important in high-fidelity audio applications. A fast settling time of 430ns to 0.1% of a 10V step with a 2kΩ/100pF load is useful in fast actuator/positioning drivers. Under similar test conditions, settling time to 0.01% is 640ns.
Both versions can also be used as comparators. Differential inputs of VCC± can be maintained without damage to the device. Open-loop propagation delay with TTL supply levels is typically 200ns. This gives a good indication as to output stage saturation recovery when the device is driven beyond the limits of recommended output swing.
Both the TLE214x and TLE214xA are available in a wide variety of packages, including both the industry-standard 8-pin small-outline version and chip form for high-density system applications. The C-suffix devices are characterized for operation from 0°C to 70°C, I-suffix devices from −40°C to 105°C, and M-suffix devices over the full military temperature range of −55°C to 125°C.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | Excalibur Low-Noise High-Speed Precision Operational Amplifiers datasheet (Rev. E) | PDF | HTML | 2025/7/11 | ||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 | |||
| 應用說明 | TLE2141 and TLE2141-Q1 EMI Immunity Performance (Rev. B) | 2015/7/1 | ||||
| 應用說明 | Bipolar Voltage Outputs for the TLV56xx Family of DACs (Rev. A) | 2015/5/18 |
設計與開發
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AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TSSOP (PW) | 16 | Ultra Librarian |
| SOIC (D) | 8 | Ultra Librarian |
| PDIP (P) | 8 | Ultra Librarian |