TL331-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- Device temperature grade 0: –40°C to 150°C ambient operating temperature range (E version)
- Device temperature grade 1: –40°C to 125°C ambient operating temperature range (B and Q versions)
- Device temperature grade 3: –40°C to 85°C ambient operating temperature range (I version)
- Device HBM ESD classification level 2
- Device CDM ESD classification level C5
- NEW TL331B-Q1 and TL391B-Q1
- Wide range of supply voltage, 2V to 36V
- Low supply-current drain independent of supply voltage: 0.43mA Typ (B version)
- Low input bias current, 3.5nA typ (B version)
- Low input offset voltage, 0.37mV typ (B Version)
- Differential input voltage range equal to maximum-rated supply voltage, ±36V
- Input range includes ground
- TL391B-Q1 provides an alternate pinout
- Output compatible With TTL, MOS and CMOS
The TL331B-Q1 and TL391B-Q1 devices are the next generation versions of the industry-standard TL331-Q1 comparator. These next generation devices provide outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, dedicated ESD protection cells with improved negative input voltage handling. The TL331B-Q1 can drop-in replace both the TL331-Q1 "I" and "Q" versions. The TL391B-Q1 provides an alternate pinout of the TL331B-Q1. The TL331E-Q1 extends the temp range up to 150ºC, meeting AEC-Q100 Grade 0 temperature requirements.
This device consists of a single voltage comparator designed to operate from a single power supply over a wide range of voltages. Operation from dual supplies also is possible if the difference between the two supplies is 2V to 36V and VCC is at least 1.5V more positive than the input common-mode voltage. Current drain is independent of the supply voltage. To achieve wired-AND relationships, one can connect the output to other open-collector outputs.
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技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | TL331B-Q1, TL391B-Q1 and TL331-Q1 Automotive Single Comparators datasheet (Rev. H) | PDF | HTML | 2025/1/23 | ||
| 應用說明 | Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. F) | PDF | HTML | 2024/12/12 | |||
| 功能安全資訊 | TL331-Q1 Functional Safety FIT Rate and Failure Mode Distribution | 2020/1/10 | ||||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 | |||
| 技術文章 | A complete low-voltage backup battery solution for eCall systems | PDF | HTML | 2016/3/5 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
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| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOT-23 (DBV) | 5 | Ultra Librarian |
訂購與品質
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。