產品詳細資料

Technology family TTL Number of channels 4 Inputs per channel 2 IOL (max) (mA) 16 IOH (max) (mA) -0.4 Input type Bipolar Output type Push-Pull Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 70 Rating Catalog Operating temperature range (°C) 0 to 70
Technology family TTL Number of channels 4 Inputs per channel 2 IOL (max) (mA) 16 IOH (max) (mA) -0.4 Input type Bipolar Output type Push-Pull Features High speed (tpd 10-50ns) Data rate (max) (Mbps) 70 Rating Catalog Operating temperature range (°C) 0 to 70
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm) PDIP (N) 14 181.42 mm² (19.3 mm × 9.4 mm)
  • Package Options Include:
    • Plastic Small-Outline (D, NS, PS)
    • Shrink Small-Outline (DB)
    • Ceramic Flat (W)
    • Ceramic Chip Carriers (FK)
    • Standard Plastic (N)
    • Ceramic (J)
  • Also Available as Dual 2-Input Positive-NAND Gate in Small-Outline (PS) Package
  • Inputs Are TTL Compliant; VIH = 2 V and
    VIL = 0.8 V
  • Inputs Can Accept 3.3-V or 2.5-V Logic Inputs
  • SN5400, SN54LS00, and SN54S00 are Characterized For Operation Over the Full Military Temperature Range of –55ºC to 125ºC
  • Package Options Include:
    • Plastic Small-Outline (D, NS, PS)
    • Shrink Small-Outline (DB)
    • Ceramic Flat (W)
    • Ceramic Chip Carriers (FK)
    • Standard Plastic (N)
    • Ceramic (J)
  • Also Available as Dual 2-Input Positive-NAND Gate in Small-Outline (PS) Package
  • Inputs Are TTL Compliant; VIH = 2 V and
    VIL = 0.8 V
  • Inputs Can Accept 3.3-V or 2.5-V Logic Inputs
  • SN5400, SN54LS00, and SN54S00 are Characterized For Operation Over the Full Military Temperature Range of –55ºC to 125ºC

The SNx4xx00 devices contain four independent,
2-input NAND gates. The devices perform the Boolean function Y = A .B or Y = A + B in positive logic.

The SNx4xx00 devices contain four independent,
2-input NAND gates. The devices perform the Boolean function Y = A .B or Y = A + B in positive logic.

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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SNx400, SNx4LS00, and SNx4S00 Quadruple 2-Input Positive-NAND Gates datasheet (Rev. D) PDF | HTML 2017/5/19

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