SN54SC8T139-SEP
- Vendor item drawing available, VID V62/25623-01XE
- Radiation - Total Ionizing Dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
- Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
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Wide operating range of 1.2V to 5.5V
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Single-supply voltage translator:
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Up translation:
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1.2V to 1.8V
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1.5V to 2.5V
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1.8V to 3.3V
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3.3V to 5.0V
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-
Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
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- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 250mA per JESD 17
- Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
The SN54SC8T139-SEP contains two two-to-four decoders with one active low output strobe G. When the outputs of one channel are gated by the strobe input, they are all forced into the high state. When the outputs are not disabled by the strobe input, only the selected output is low while all others are high.
技術文件
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檢視所有 4 | 重要文件 | 類型 | 標題 | 格式選項 | 日期 |
|---|---|---|---|---|
| * | Data sheet | SN54SC8T139-SEP Radiation Tolerant, Dual 2 to 4-Bit Decoders/Demultiplexers datasheet | PDF | HTML | 2025年 1月 20日 |
| * | Radiation & reliability report | SN54SC8T139-SEP Production Flow and Reliability Report | PDF | HTML | 2025年 2月 21日 |
| * | Radiation & reliability report | SN54SC8T138-SEP Single-Event Effects (SEE) Radiation Report | PDF | HTML | 2025年 2月 20日 |
| * | Radiation & reliability report | SN54SC8T139-SEP Total Ionizing Dose (TID) Report | 2025年 2月 18日 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
開發板
14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
開發板
14-24-NL-LOGIC-EVM — 適用於 14 針腳至 24 針腳無引線封裝的邏輯產品通用評估模組
14-24-NL-LOGIC-EVM 是一款靈活的評估模組 (EVM)，設計用於支援任何具有 14 針腳至 24 針腳 BQA、BQB、RGY、RSV、RJW 或 RHL 封裝的邏輯或轉換裝置。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TSSOP (PW) | 16 | Ultra Librarian |
訂購與品質
內含資訊：
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中的可靠性監測
內含資訊：
- 晶圓廠位置
- 組裝地點