產品詳細資料

Number of channels 8 IOL (max) (mA) 8 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type 3-State Features Balanced outputs, Over-voltage tolerant inputs Technology family SLC Rating Space Operating temperature range (°C) -55 to 125
Number of channels 8 IOL (max) (mA) 8 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type 3-State Features Balanced outputs, Over-voltage tolerant inputs Technology family SLC Rating Space Operating temperature range (°C) -55 to 125
TSSOP (PW) 20 41.6 mm² (6.5 mm × 6.4 mm)
  • Vendor item drawing available, VID V62/23616
  • Total ionizing dose characterized at 30 krad(Si)
    • Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2 V to 5.5 V
  • 5.5 V tolerant input pins
  • Output drive up to 25 mA at 5-V
  • Latch-up performance exceeds 250 mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification
  • Vendor item drawing available, VID V62/23616
  • Total ionizing dose characterized at 30 krad(Si)
    • Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2 V to 5.5 V
  • 5.5 V tolerant input pins
  • Output drive up to 25 mA at 5-V
  • Latch-up performance exceeds 250 mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification

SN54SC245-SEP is an octal bus transceiver with 3-state outputs. All eight channels are controlled by the direction (DIR) pin and output enable ( OE) pin. The output enable ( OE) controls all outputs in the device. When the OE pin is in the low state, the appropriate outputs as determined by the direction (DIR) pin are enabled. When the OE pin is in the high state, all outputs of the device are disabled. All disabled outputs are placed into the high-impedance state.

SN54SC245-SEP is an octal bus transceiver with 3-state outputs. All eight channels are controlled by the direction (DIR) pin and output enable ( OE) pin. The output enable ( OE) controls all outputs in the device. When the OE pin is in the low state, the appropriate outputs as determined by the direction (DIR) pin are enabled. When the OE pin is in the high state, all outputs of the device are disabled. All disabled outputs are placed into the high-impedance state.

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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN54SC245-SEP Radiation-Tolerant, 1.2-V to 5.5-V, Octal Bus TransceiversWith 3-State Outputs datasheet PDF | HTML 2023/8/23
* 輻射及可靠性報告 SN54SC245-SEP Single Event Latch-Up Report PDF | HTML 2023/10/17
* 輻射及可靠性報告 SN54SC245-SEP Reliability Report PDF | HTML 2023/8/23
* 輻射及可靠性報告 SN54SC245-SEP Total Ionizing Dose Report PDF | HTML 2023/8/16
Application brief TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms PDF | HTML 2024/9/10

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