現在提供此產品的更新版本
具備升級功能,可直接投入使用替代所比較的裝置。
LF347-N
- Internally Trimmed Offset Voltage: 5 mV max
- Low Input Bias Current: 50 pA
- Low Input Noise Current: 0.01 pA/√Hz
- Wide Gain Bandwidth: 4 MHz
- High Slew Rate: 13 V/μs
- Low Supply Current: 7.2 mA
- High Input Impedance: 1012Ω
- Low Total Harmonic Distortion: ≤0.02%
- Low 1/f Noise Corner: 50 Hz
- Fast Settling Time to 0.01%: 2 μs
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The LF147 is a low cost, high speed quad JFET input operational amplifier with an internally trimmed input offset voltage (BI-FET II technology). The device requires a low supply current and yet maintains a large gain bandwidth product and a fast slew rate. In addition, well matched high voltage JFET input devices provide very low input bias and offset currents. The LF147 is pin compatible with the standard LM148. This feature allows designers to immediately upgrade the overall performance of existing LF148 and LM124 designs.
The LF147 may be used in applications such as high speed integrators, fast D/A converters, sample-and-hold circuits and many other circuits requiring low input offset voltage, low input bias current, high input impedance, high slew rate and wide bandwidth. The device has low noise and offset voltage drift.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | LF147/LF347 Wide Bandwidth Quad JFET Input Operational Amplifiers datasheet (Rev. D) | 2013/3/25 | |||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 | |||
| 應用說明 | AN-262 Applying Dual and Quad FET Op Amps (Rev. B) | 2013/5/6 | ||||
| 應用說明 | AN-301 Signal Conditioning for Sophisticated Transducers (Rev. B) | 2013/5/6 | ||||
| 應用說明 | AN-256 Circuitry for Inexpensive Relative Humidity Measurement (Rev. B) | 2013/5/6 | ||||
| 應用說明 | AN-263 Sine Wave Generation Techniques (Rev. C) | 2013/4/22 | ||||
| 應用說明 | AN-447 Protection Schemes for BI-FET Amplifiers and Switches | 2004/5/2 | ||||
| 應用說明 | Get More Power Out of Dual or Quad Op-Amps | 2002/10/2 |
設計與開發
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AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (D) | 14 | Ultra Librarian |
| PDIP (N) | 14 | Ultra Librarian |