產品詳細資料

Number of channels 1 Vs (min) (V) 4 Vs (max) (V) 18 CMRR (min) (dB) 84 Common-mode input low (min) (V) -150 Common-mode input high (max) (V) 150 Input offset (±) (max) (V) 0.0035 Iq (typ) (mA) 0.81 Slew rate (typ) (V/µs) 5 Voltage gain (min) (V/V) 1 Voltage gain (max) (V/V) 1 Small-signal bandwidth (typ) (Hz) 500000 Rating Space Operating temperature range (°C) -55 to 125 Gain error (±) (max) (%) 0.047
Number of channels 1 Vs (min) (V) 4 Vs (max) (V) 18 CMRR (min) (dB) 84 Common-mode input low (min) (V) -150 Common-mode input high (max) (V) 150 Input offset (±) (max) (V) 0.0035 Iq (typ) (mA) 0.81 Slew rate (typ) (V/µs) 5 Voltage gain (min) (V/V) 1 Voltage gain (max) (V/V) 1 Small-signal bandwidth (typ) (Hz) 500000 Rating Space Operating temperature range (°C) -55 to 125 Gain error (±) (max) (%) 0.047
CFP (HKX) 8 155.4 mm² 6.475 x 24
  • QML Class V (QMLV), RHA, SMD (5962R2121201VXC)
  • Radiation performance
    • RHA up to TID = 100krad(Si)
    • ELDRS-free up to TID = 100krad(Si)
    • SEL immune to LET = 75MeV×cm2 /mg
    • SEE characterized to LET = 75MeV×cm2 /mg
  • Common-mode voltage range: ±150V
  • Minimum CMRR: 84dB from –55°C to +125°C
  • DC specifications:
    • Maximum offset voltage: 3500µV
    • Typical offset voltage drift: 3µV/°C
    • Maximum gain error: 0.047%
    • Typical gain error drift: 1.5ppm/°C
    • Typical gain nonlinearity: 0.0005% FSR
  • AC performance:
    • Small-signal bandwidth: 500kHz
    • Typical slew rate: 5V/µs
  • Wide supply range: ±2V to ±9V
    • Maximum quiescent current: 900µA
    • Output swing on ±9V supplies: ±7.5V
  • QML Class V (QMLV), RHA, SMD (5962R2121201VXC)
  • Radiation performance
    • RHA up to TID = 100krad(Si)
    • ELDRS-free up to TID = 100krad(Si)
    • SEL immune to LET = 75MeV×cm2 /mg
    • SEE characterized to LET = 75MeV×cm2 /mg
  • Common-mode voltage range: ±150V
  • Minimum CMRR: 84dB from –55°C to +125°C
  • DC specifications:
    • Maximum offset voltage: 3500µV
    • Typical offset voltage drift: 3µV/°C
    • Maximum gain error: 0.047%
    • Typical gain error drift: 1.5ppm/°C
    • Typical gain nonlinearity: 0.0005% FSR
  • AC performance:
    • Small-signal bandwidth: 500kHz
    • Typical slew rate: 5V/µs
  • Wide supply range: ±2V to ±9V
    • Maximum quiescent current: 900µA
    • Output swing on ±9V supplies: ±7.5V

The INA1H94-SP is a radiation-hardened precision unity-gain difference amplifier with a very high input common-mode voltage range. The INA1H94-SP is a single, monolithic device that consists of a precision op amp and an integrated thin-film resistor network. The INA1H94-SP can accurately measure small differential voltages in the presence of common-mode signals up to ±150V.

In many applications where galvanic isolation in not required, the INA1H94-SP can replace isolation amplifiers. The INA1H94-SP can help eliminate costly isolated input side power supplies, along with the associated ripple, noise, and quiescent current. The excellent 0.0005% typical nonlinearity, high common-mode, and 500kHz bandwidth of the INA1H94-SP makes for a compelling sensor readout device.

The INA1H94-SP is a radiation-hardened precision unity-gain difference amplifier with a very high input common-mode voltage range. The INA1H94-SP is a single, monolithic device that consists of a precision op amp and an integrated thin-film resistor network. The INA1H94-SP can accurately measure small differential voltages in the presence of common-mode signals up to ±150V.

In many applications where galvanic isolation in not required, the INA1H94-SP can replace isolation amplifiers. The INA1H94-SP can help eliminate costly isolated input side power supplies, along with the associated ripple, noise, and quiescent current. The excellent 0.0005% typical nonlinearity, high common-mode, and 500kHz bandwidth of the INA1H94-SP makes for a compelling sensor readout device.

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重要文件 類型 標題 格式選項 日期
* Data sheet INA1H94-SP Radiation-Hardened, High Common-Mode Voltage Difference Amplifier datasheet (Rev. B) PDF | HTML 2025年 8月 7日
* Radiation & reliability report INA1H94-SP Single-Event Effects (SEE) Radiation Report PDF | HTML 2025年 7月 23日
* Radiation & reliability report INA1H94-SP Neutron Displacement Damage (NDD) Characterization 2025年 7月 17日
* Radiation & reliability report INA1H94-SP Radiation-Hardened, High Common-Mode Voltage Difference Amplifier TID Report 2025年 7月 17日
Selection guide TI Space Products (Rev. L) 2026年 3月 27日
Design guide Radiation-Hardened Space Battery Management System (BMS) Reference Design 2025年 7月 30日
Certificate INA1H94EVM EU Declaration of Conformity (DoC) 2025年 6月 4日

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封裝 針腳 CAD 符號、佔位空間與 3D 模型
CFP (HKX) 8 Ultra Librarian

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