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數據轉換器
類比轉數位轉換器 (ADC)
高速 ADC (≥10 MSPS)

ADC12DL3200

現行

12 位元、雙 3.2-GSPS 或單 6.4-GSPS、射頻取樣類比轉數位轉換器 (LVDS 介面)

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產品規格表

ADC12DL3200

現行
產品規格表 立即訂購

產品詳細資料

Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type DDR LVDS, Parallel LVDS Analog input BW (MHz) 8000 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3150 Architecture Folding Interpolating SNR (dB) 57.9 ENOB (Bits) 9 SFDR (dB) 78 Operating temperature range (°C) -40 to 85 Input buffer Yes
Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type DDR LVDS, Parallel LVDS Analog input BW (MHz) 8000 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3150 Architecture Folding Interpolating SNR (dB) 57.9 ENOB (Bits) 9 SFDR (dB) 78 Operating temperature range (°C) -40 to 85 Input buffer Yes
FCBGA (ACF) 256 289 mm² 17 x 17 FCBGA (ALJ) 256 289 mm² 17 x 17
  • ADC Core:
    • 12-Bit Resolution
    • Up to 6.4 GSPS in Single-Channel Mode
    • Up to 3.2 GSPS in Dual-Channel Mode
  • Internal Dither for Low-Magnitude, High-Order Harmonics
  • Low-Latency LVDS Interface:
    • Total Latency: < 10 ns
    • Up to 48 Data Pairs at 1.6 Gbps
    • Four DDR Data Clocks
    • Strobe Signals Simplify Synchronization
  • Noise Floor (No Input, V FS = 1.0 V PP-DIFF):
    • Dual-Channel Mode: –151.1 dBFS/Hz
    • Single-Channel Mode: –154.3 dBFS/Hz
  • Buffered Analog Inputs With V CMI of 0 V:
    • Analog Input Bandwidth (–3 dB): 8.0 GHz
    • Usable Input Frequency Range: > 10 GHz
    • Full-Scale Input Voltage (V FS, Default): 0.8 V PP
  • Noiseless Aperture Delay (T AD) Adjustment:
    • Precise Sampling Control: 19-fs Step
    • Simplifies Synchronization and Interleaving
    • Temperature and Voltage Invariant Delays
  • Easy-to-Use Synchronization Features:
    • Automatic SYSREF Timing Calibration
    • Timestamp for Sample Marking
  • Power Consumption: 3.15 W
  • ADC Core:
    • 12-Bit Resolution
    • Up to 6.4 GSPS in Single-Channel Mode
    • Up to 3.2 GSPS in Dual-Channel Mode
  • Internal Dither for Low-Magnitude, High-Order Harmonics
  • Low-Latency LVDS Interface:
    • Total Latency: < 10 ns
    • Up to 48 Data Pairs at 1.6 Gbps
    • Four DDR Data Clocks
    • Strobe Signals Simplify Synchronization
  • Noise Floor (No Input, V FS = 1.0 V PP-DIFF):
    • Dual-Channel Mode: –151.1 dBFS/Hz
    • Single-Channel Mode: –154.3 dBFS/Hz
  • Buffered Analog Inputs With V CMI of 0 V:
    • Analog Input Bandwidth (–3 dB): 8.0 GHz
    • Usable Input Frequency Range: > 10 GHz
    • Full-Scale Input Voltage (V FS, Default): 0.8 V PP
  • Noiseless Aperture Delay (T AD) Adjustment:
    • Precise Sampling Control: 19-fs Step
    • Simplifies Synchronization and Interleaving
    • Temperature and Voltage Invariant Delays
  • Easy-to-Use Synchronization Features:
    • Automatic SYSREF Timing Calibration
    • Timestamp for Sample Marking
  • Power Consumption: 3.15 W

The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.

The ADC12DL3200 is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DL3200 can sample up to 3200 MSPS and in single-channel mode up to 6400 MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high-channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz and a useable frequency range allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DL3200 uses a low-latency, low-voltage differential signaling (LVDS) interface for latency sensitive applications or when the simplicity of LVDS is preferred. The interface uses up to 48 data pairs, four double data rate (DDR) clocks, and four strobe signals arranged in four 12-bit data buses. The interface supports signaling rates of up to 1.6 Gbps. Strobe signals simplify synchronization across buses and between multiple devices. The strobe is generated internally and can be reset at a deterministic time by the SYSREF input. Multi-device synchronization is further eased by innovative synchronization features such as noiseless aperture delay (T AD) adjustment and SYSREF windowing.
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類型 標題 日期
* Data sheet ADC12DL3200 6.4-GSPS Single-Channel or 3.2-GSPS Dual-Channel, 12-Bit Analog-to-Digital Converter (ADC) With LVDS Interface datasheet (Rev. C) PDF | HTML 2023年 5月 23日
Technical article So, what are S-parameters anyway? PDF | HTML 2019年 5月 23日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

ADC12DL3200EVM — ADC12DL3200 12 位元、雙通道 3.2GSPS 或單通道 6.4GSPS 射頻取樣 ADC 評估模組

ADC12DJ3200 評估模組 (EVM) 專為評估 ADC12DJ3200 高速類比轉數位轉換器 (ADC) 所設計。本 EVM 搭載 ADC12DJ3200 晶片，該晶片為具備 LVDS 介面的 12 位元、雙通道 3.2GSPS 或單通道 6.4GSPS ADC。
使用指南: PDF | HTML
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韌體

SLVC814 — TSW14DL3200 ADC12DL3200 Reference Design Firmware

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產品
高速 ADC (≥10 MSPS)
  • ADC12DL3200 — 12 位元、雙 3.2-GSPS 或單 6.4-GSPS、射頻取樣類比轉數位轉換器 (LVDS 介面)
硬體開發
開發板
  • TSW14DL3200EVM — 數據擷取/模式產生器：具有 48 個最高達 1.6Gbps 之 LVDS 通道的數據轉換器評估模組
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開發模組 (EVM) 的 GUI

SLVC719 — ADC12DLxx00EVM GUI

支援產品和硬體

支援產品和硬體

產品
高速 ADC (≥10 MSPS)
  • ADC12DL3200 — 12 位元、雙 3.2-GSPS 或單 6.4-GSPS、射頻取樣類比轉數位轉換器 (LVDS 介面)
硬體開發
開發板
  • ADC12DL3200EVM — ADC12DL3200 12 位元、雙通道 3.2GSPS 或單通道 6.4GSPS 射頻取樣 ADC 評估模組
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外掛程式

ABACO-3P-FMC172 — Abaco Systems ® 寬帶低延遲高速 ADC/DAC 模組夾層介面卡

Abaco FMC172 模組強調於配備 FPGA 夾層介面卡 (FMC) 連接器之子卡中的德州儀器 (TI) 低延遲 ADC12DL3200 單通道 6.4-GSPS 類比轉數位轉換器 (ADC) 。結合 FMC172 大於 6GHz 頻寬、高取樣率和低延遲，最適用於進階數位射頻記憶體 (DRFM) 系統。
從：Abaco Systems
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模擬型號

ADC12DL3200 IBIS Model

SLVMCP2.ZIP (53 KB) - IBIS Model
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模擬型號

ADC12DL3200 IBIS Model (Rev. A)

SLVMCP2A.ZIP (68 KB) - IBIS Model
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