SN74LVC1G79-Q1
- Qualified for Automotive Applications
- AEC-Q100 Qualified With the Following Results:
- ±4000-V Human-Body Model (HBM) ESD Classification Level 3A
- ±1000-V Charged-Device Model (CDM) ESD Classification Level C5
- Supports 5-V VCC Operation
- Inputs Accept Voltages to 5.5 V
- Supports Down Translation to VCC
- Max tpd of 6 ns at 3.3 V and 50 pF load
- Low Power Consumption, 10-µA Max ICC
- ±24-mA Output Drive at 3.3 V
- Ioff supports Partial-Power-Down Mode and Back-Drive Protection
This automotive AEC-Q100 qualified single positive-edge-triggered D-type flip-flop is designed for 1.65-V to 5.5-V VCC operation.
When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the level at the output.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
기술 자료
| 상위 문서 | 유형 | 직함 | 형식 옵션 | 최신 영어 버전 다운로드 | 날짜 | |
|---|---|---|---|---|---|---|
| * | 데이터 시트 | SN74LVC1G79-Q1 Single Positive-Edge-Triggered D-Type Flip-Flop datasheet | PDF | HTML | 2017. 3. 24 |
설계 및 개발
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5-8-LOGIC-EVM — 5핀~8핀 DCK, DCT, DCU, DRL 및 DBV 패키지용 일반 논리 평가 모듈
| 패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
|---|---|---|
| SOT-SC70 (DCK) | 5 | Ultra Librarian |