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Technology family SCxT Number of channels 8 Operating temperature range (°C) -55 to 125 Rating Space
Technology family SCxT Number of channels 8 Operating temperature range (°C) -55 to 125 Rating Space
TSSOP (PW) 16 32 mm² (5 mm × 6.4 mm)
  • Vendor item drawing available, VID V62/25624-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
  • Vendor item drawing available, VID V62/25624-01XE
  • Radiation - Total Ionizing Dose (TID):
    • TID characterized up to 50krad(Si)
    • TID performance assurance up to 30krad(Si)
    • Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
  • Radiation - Single-Event Effects (SEE):
    • Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
    • Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
  • Wide operating range of 1.2V to 5.5V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2V to 1.8V

      • 1.5V to 2.5V

      • 1.8V to 3.3V

      • 3.3V to 5.0V

    • Down translation:

      • 5.0V, 3.3V, 2.5V to 1.8V
      • 5.0V, 3.3V to 2.5V
      • 5.0V to 3.3V
  • 5.5V tolerant input pins
  • Supports standard pinouts
  • Up to 150Mbps with 5V or 3.3V VCC
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic:
    • Supports defense and aerospace applications
    • Controlled baseline
    • Au bondwire and NiPdAu lead finish
    • Meets NASA ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability

The SN54SC8T157-SEP contains four data selectors/multiplexers to select one of two data sources. All channels are controlled by the same address select (A/B) input, and strobe (G) input. A high level at the strobe terminal forces all outputs low.

The SN54SC8T157-SEP contains four data selectors/multiplexers to select one of two data sources. All channels are controlled by the same address select (A/B) input, and strobe (G) input. A high level at the strobe terminal forces all outputs low.

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기술 자료

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4개 모두 보기
상위 문서 유형 직함 형식 옵션 최신 영어 버전 다운로드 날짜
* 데이터 시트 SN54SC8T157-SEP Radiation Tolerant, Quadruple 2-Line to 1-Line Data Selectors/Multiplexers datasheet PDF | HTML 2025. 1. 21
* 방사능 및 안정성 보고서 SN54SC8T157-SEP Production Flow and Reliability Report PDF | HTML 2025. 2. 21
* 방사능 및 안정성 보고서 SN54SC8T138-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 2025. 2. 20
* 방사능 및 안정성 보고서 SN54SC8T157-SEP Total Ionizing Dose (TID) Report 2025. 2. 19

설계 및 개발

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평가 보드

14-24-NL-LOGIC-EVM — 14핀~24핀 비 리드 패키지용 로직 제품 일반 평가 모듈

14-24-NL-LOGIC-EVM은 14핀~24핀 BQA, BQB, RGY, RSV, RJW 또는 RHL 패키지가 있는 로직 또는 변환 장치를 지원하도록 설계된 유연한 평가 모듈(EVM)입니다.

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