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UCC21222-Q1

AKTIV

Automotive Basic, 4A/6A dual-channel isolated gate driver w/ disable, programmable deadtime

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Drop-In-Ersatz mit gegenüber dem verglichenen Baustein verbesserter Funktionalität.
UCC21330-Q1 AKTIV Automotive Basic, 4A/6A dual-channel isolated gate driver w/ disable, programmable deadtime Improved CMTI, faster VDD startup

Produktdetails

Number of channels 2 Isolation rating Basic Power switch IGBT, MOSFET Withstand isolation voltage (VISO) (Vrms) 3000 Working isolation voltage (VIOWM) (Vrms) 700 Transient isolation voltage (VIOTM) (VPK) 4242 Peak output current (A) 6 Peak output current (source) (typ) (A) 4 Peak output current (sink) (typ) (A) 6 Features Disable, Programmable dead time Output VCC/VDD (min) (V) 9.2 Output VCC/VDD (max) (V) 18 Input supply voltage (min) (V) 3 Input supply voltage (max) (V) 5.5 Propagation delay time (µs) 0.025 Input threshold CMOS, TTL Operating temperature range (°C) -40 to 125 Rating Automotive Rise time (ns) 5 Fall time (ns) 6 Undervoltage lockout (typ) (V) 8 TI functional safety category Functional Safety-Capable
Number of channels 2 Isolation rating Basic Power switch IGBT, MOSFET Withstand isolation voltage (VISO) (Vrms) 3000 Working isolation voltage (VIOWM) (Vrms) 700 Transient isolation voltage (VIOTM) (VPK) 4242 Peak output current (A) 6 Peak output current (source) (typ) (A) 4 Peak output current (sink) (typ) (A) 6 Features Disable, Programmable dead time Output VCC/VDD (min) (V) 9.2 Output VCC/VDD (max) (V) 18 Input supply voltage (min) (V) 3 Input supply voltage (max) (V) 5.5 Propagation delay time (µs) 0.025 Input threshold CMOS, TTL Operating temperature range (°C) -40 to 125 Rating Automotive Rise time (ns) 5 Fall time (ns) 6 Undervoltage lockout (typ) (V) 8 TI functional safety category Functional Safety-Capable
SOIC (D) 16 59.4 mm² (9.9 mm × 6 mm)
  • Universal: dual low-side, dual high-side or half-bridge driver
  • AEC Q100 qualified with:
    • Device temperature grade 1
    • Device HBM ESD classification level H2
    • Device CDM ESD classification level C4B
  • Junction temperature range –40°C to 150°C
  • 4A peak source, 6A peak sink output
  • Common-mode transient immunity (CMTI) greater than 125V/ns
  • Up to 25V VDD output drive supply
    • 8V VDD UVLO
  • Switching parameters:
    • 33ns typical propagation delay
    • 5ns maximum pulse-width distortion
    • 10µs maximum VDD power-up delay
  • UVLO protection for all power supplies
  • Fast disable for power sequencing
  • Universal: dual low-side, dual high-side or half-bridge driver
  • AEC Q100 qualified with:
    • Device temperature grade 1
    • Device HBM ESD classification level H2
    • Device CDM ESD classification level C4B
  • Junction temperature range –40°C to 150°C
  • 4A peak source, 6A peak sink output
  • Common-mode transient immunity (CMTI) greater than 125V/ns
  • Up to 25V VDD output drive supply
    • 8V VDD UVLO
  • Switching parameters:
    • 33ns typical propagation delay
    • 5ns maximum pulse-width distortion
    • 10µs maximum VDD power-up delay
  • UVLO protection for all power supplies
  • Fast disable for power sequencing

The UCC21222-Q1 device is an isolated dual channel gate driver with programmable dead time and a wide temperature range. This device exhibits consistent performance and robustness under extreme temperature conditions. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, IGBT, and GaN transistors.

The UCC21222-Q1 device can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. A 5ns delay matching performance allows two outputs to be paralleled, doubling the drive strength for heavy load conditions without risk of internal shoot-through.

The input side is isolated from the two output drivers by a 3.0kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI).

Resistor programmable dead time gives the capability to adjust dead time for system constraints to improve efficiency and prevent output overlap. Other protection features include a disable feature to shut down both outputs simultaneously when DIS is set high, an integrated deglitch filter that rejects input transients shorter than 5ns, and negative voltage handling for up to –2V spikes for 200ns on input and output pins. All supplies have UVLO protection.

The UCC21222-Q1 device is an isolated dual channel gate driver with programmable dead time and a wide temperature range. This device exhibits consistent performance and robustness under extreme temperature conditions. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, IGBT, and GaN transistors.

The UCC21222-Q1 device can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. A 5ns delay matching performance allows two outputs to be paralleled, doubling the drive strength for heavy load conditions without risk of internal shoot-through.

The input side is isolated from the two output drivers by a 3.0kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI).

Resistor programmable dead time gives the capability to adjust dead time for system constraints to improve efficiency and prevent output overlap. Other protection features include a disable feature to shut down both outputs simultaneously when DIS is set high, an integrated deglitch filter that rejects input transients shorter than 5ns, and negative voltage handling for up to –2V spikes for 200ns on input and output pins. All supplies have UVLO protection.

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Technische Dokumentation

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Top-Dokumentation Typ Titel Format-Optionen Neueste englische Version herunterladen Datum
* Datenblatt UCC21222-Q1 Automotive 4A, 6A, 3kVRMS Isolated Dual-Channel Gate Driver with Dead Time datasheet (Rev. B) PDF | HTML 02.04.2024
* Benutzerhandbuch Gate Drive Voltage vs. Efficiency 25.04.2019
Zertifikat VDE Certificate for Basic Isolation for DIN EN IEC 60747-17 (Rev. AA) 11.06.2026
Whitepaper Addressing High-Volt Design Challenges w/ Reliable and Affordable Isolation Tech (Rev. D) PDF | HTML 15.05.2026
Informationen zur funktionalen Sicherheit UCC21222-Q1 and UCC21330-Q1 Functional Safety FIT Rate, FMD and Pin FMA (Rev. B) PDF | HTML 30.01.2025
Anwendungshinweis Impact of Narrow Pulse Widths in Gate Driver Circuits (Rev. A) PDF | HTML 25.01.2024
Zertifikat UCC21220 CQC Certificate of Product Certification PDF | HTML 16.08.2023
Application brief The Use and Benefits of Ferrite Beads in Gate Drive Circuits PDF | HTML 16.12.2021
Application brief External Gate Resistor Selection Guide (Rev. A) 28.02.2020
Application brief Understanding Peak IOH and IOL Currents (Rev. A) 28.02.2020
Zertifikat UL Certification E181974 Vol 4. Sec 9 (Rev. A) 22.07.2019
Whitepaper Driving the future of HEV/EV with high-voltage solutions (Rev. B) 16.05.2018
Anwendungshinweis Isolation Glossary (Rev. A) 19.09.2017
Technischer Artikel Are you on-board? Demystifying EV charging systems PDF | HTML 31.07.2017

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