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Highspeed-ADCs (≥ 10 MSPS)

ADC12DJ3200QML-SP

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Radiation-hardened, QML-V, 300krad, 12 bit, dual 3.2GSPS or single 6.4GSPS ADC

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ADC12DJ3200QML-SP

AKTIV
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Produktdetails

Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
Sample rate (max) (Msps) 3200, 6400 Resolution (Bits) 12 Number of input channels 1, 2 Interface type JESD204B Analog input BW (MHz) 7300 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3000 Architecture Folding Interpolating SNR (dB) 57.2 ENOB (Bits) 8.9 SFDR (dB) 76 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
CCGA-FC (NWE) 196 225 mm² (15 mm × 15 mm)
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4GSPS in single-channel mode
    • Up to 3.2GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1VPP-DIFF):
    • Dual-channel mode: –149.5dBFS/Hz
    • Single-channel mode: –152.4dBFS/Hz
  • Peak noise power ratio (NPR): 45.4dB
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 7GHz
    • Usable input frequency range: >10GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300krad (Si)
    • Single Event Latchup (SEL): 120MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3W
  • ADC core:
    • 12-Bit resolution
    • Up to 6.4GSPS in single-channel mode
    • Up to 3.2GSPS in dual-channel mode
  • Noise floor (no signal, VFS = 1VPP-DIFF):
    • Dual-channel mode: –149.5dBFS/Hz
    • Single-channel mode: –152.4dBFS/Hz
  • Peak noise power ratio (NPR): 45.4dB
  • Buffered analog inputs with VCMI of 0V:
    • Analog input bandwidth (–3dB): 7GHz
    • Usable input frequency range: >10GHz
    • Full-scale input voltage (VFS, default): 0.8VPP
  • Noiseless aperture delay (tAD) adjustment:
    • Precise sampling control: 19fs step size
    • Temperature and voltage invariant delays
  • Easy-to-use synchronization features
    • Automatic SYSREF timing calibration
    • Timestamp for sample marking
  • JESD204B subclass-1 compliant interface:
    • Maximum lane rate: 12.8Gbps
    • Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode:
    • Real output: DDC bypass or 2x decimation
    • Complex output: 4x, 8x, or 16x decimation
  • Radiation performance:
    • Total Ionizing Dose (TID): 300krad (Si)
    • Single Event Latchup (SEL): 120MeV-cm2/mg
    • Single Event Upset (SEU) immune registers
  • Power consumption: 3W

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200MSPS. In single-channel mode, the device can sample up to 6400MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 7GHz, with usable frequencies exceeding the –3dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200QML-SP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from dc to above 10GHz. In dual-channel mode, the ADC12DJ3200QML-SP can sample up to 3200MSPS. In single-channel mode, the device can sample up to 6400MSPS. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3dB) of 7GHz, with usable frequencies exceeding the –3dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems.

The ADC12DJ3200QML-SP uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multidevice synchronization. The serial output lanes support up to 12.8Gbps, and can be configured to trade off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (tAD) adjustment and SYSREF windowing, simplify system design for synthetic aperture radar (SAR) and phased-array MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).
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Technische Dokumentation

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* Datenblatt ADC12DJ3200QML-SP 6.4GSPS, Single-Channel or 3.2GSPS, Dual-Channel, 12-Bit, RF-Sampling Analog-to-Digital Converter (ADC) datasheet (Rev. C) PDF | HTML 21.03.2025
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Design und Entwicklung

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Evaluierungsplatine

ADC12DJ3200EVMCVAL — ADC12DJ3200QML-SP-Evaluierungsmodul

Das ADC12DJ3200 Evaluierungsmodul (EVM) wurde entwickelt, um die ADC12DJ3200QML-SP hochgeschwindigkeits Analog-Digital-Wandler (ADCs) zu bewerten. Das Evaluierungsmodul ist mit dem ADC12DJ3200QML-SP bestückt, einem hochbelastbaren 12-Bit, Dual-Channel 4 GSPS oder Single-Channel 8 GSPS ADC mit (...)
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Firmware

TI204C-IP — Request for JESD204 rapid design IP

Die JESD204 Rapid Design IP ist dazu entwickelt worden, FPGA-Technikern einen beschleunigten Weg zu einem funktionierenden JESD204-System zu ermöglichen. Diese IP ist derart ausgelegt worden, dass nachgelagerte digitale Verarbeitung und sonstige Anwendungslogik von den meisten leistungs- und (...)

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Simulationsmodell

ADC12DJ3200 and ADC12DJ3200QML-SP IBIS and IBIS-AMI Model

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ADC12DJ3200QML-SP S-Parameter Model

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