SCAN921226H

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具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位解串器

产品详情

Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
NFBGA (NZA) 49 49 mm² 7 x 7
  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

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类型 标题 下载最新的英语版本 日期
* 数据表 High Temp 20-80MHz 10Bit Bus LVDS SerDes w/IEEE 1149.1 JTAG & at-speed BIST 数据表 (Rev. C) 2013年 5月 2日
应用手册 DS15BA101 & DS15EA101 Enable Long Reach Applications for Embedded Clock SER/DES (Rev. E) 2013年 4月 29日
应用手册 App Note 1909 DS15BA101 & DS15EA101 Enable Long Reach Apps for Embed Clk SERDES 2009年 3月 2日

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用户指南: PDF
英语版 (Rev.A): PDF
封装 引脚 下载
NFBGA (NZA) 49 查看选项

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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